Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Gorman, Brian P.
Norman, Andrew G.
and
Yan, Yanfa
2007.
Atom Probe Analysis of III–V and Si-Based Semiconductor Photovoltaic Structures.
Microscopy and Microanalysis,
Vol. 13,
Issue. 6,
p.
493.
Kelly, Thomas F.
and
Larson, David J.
2012.
Atom Probe Tomography 2012.
Annual Review of Materials Research,
Vol. 42,
Issue. 1,
p.
1.
Bleuet, P.
Audoit, G.
Barnes, J.-P.
Bertheau, J.
Dabin, Y.
Dansas, H.
Fabbri, J.-M.
Florin, B.
Gergaud, P.
Grenier, A.
Haberfehlner, G.
Lay, E.
Laurencin, J.
Serra, R.
and
Villanova, J.
2013.
Specifications for Hard Condensed Matter Specimens for Three-Dimensional High-Resolution Tomographies.
Microscopy and Microanalysis,
Vol. 19,
Issue. 3,
p.
726.
Tkadletz, Michael
Lechner, Alexandra
Pölzl, Silvia
and
Schalk, Nina
2021.
Anisotropic wet-chemical etching for preparation of freestanding films on Si substrates for atom probe tomography: A simple yet effective approach.
Ultramicroscopy,
Vol. 230,
Issue. ,
p.
113402.
Macauley, Chandra
Heller, Martina
Rausch, Alexander
Kümmel, Frank
Felfer, Peter
and
Stephenson, Leigh T.
2021.
A versatile cryo-transfer system, connecting cryogenic focused ion beam sample preparation to atom probe microscopy.
PLOS ONE,
Vol. 16,
Issue. 1,
p.
e0245555.
2022.
Atomic-Scale Analytical Tomography.
p.
98.
Tkadletz, Michael
Waldl, Helene
Schiester, Maximilian
Lechner, Alexandra
Schusser, Georg
Krause, Michael
and
Schalk, Nina
2023.
Efficient preparation of microtip arrays for atom probe tomography using fs-laser processing.
Ultramicroscopy,
Vol. 246,
Issue. ,
p.
113672.
Tkadletz, Michael
Schiester, Maximilian
Waldl, Helene
Schusser, Georg
Krause, Michael
and
Schalk, Nina
2024.
fs-laser preparation of half grid specimens for atom probe tomography and transmission electron microscopy.
Materials Today Communications,
Vol. 39,
Issue. ,
p.
108672.