Microscopy and Microanalysis: Volume 10 -

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Volume 10 - August 2004

Contents

Page 34 of 48

Aberration Correction, Electron Holography, High-Resolution TEM

Research Article

A Standard for Sub-Ångstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes
Michael A. O'Keefe, Lawrence F. Allard
Published online by Cambridge University Press:

01 August 2004, pp. 1002-1003
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Cs Corrector for Illumination
Hidetaka Sawada, Takeshi Tomita, Mikio Naruse, Toshikazu Honda, Peter Hartel, Max Haider, Crispin J D Hetherington, Ron C Doole, Angus I Kirkland, John L Hutchison, John M Titchmarsh, David J H Cockayne
Published online by Cambridge University Press:

01 August 2004, pp. 1004-1005
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Possibility of Cs-Corrected High-Resolution Electron Microscopy of CTF of cosχ for Silicon Crystals
Nobuo Tanaka, Tomoykui Kawai, Jun Yamasaki
Published online by Cambridge University Press:

01 August 2004, pp. 1006-1007
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Confocal Electron Holography
Rodney A Herring
Published online by Cambridge University Press:

01 August 2004, pp. 1008-1009
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

The Prospect of Three-Dimensional Induction Mapping Inside Magnetic Nanostructures by Combining Electron Holography with Electron Tomography
Rafal E Dunin-Borkowski, Takeshi Kasama
Published online by Cambridge University Press:

01 August 2004, pp. 1010-1011
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

An Ultra-High-Tilt Two-Contact Electrical Biasing Specimen Holder for Electron Holography and Electron Tomography of Semiconductor Devices
Rafal E Dunin-Borkowski, Alison C Twitchett, Jonathan S Barnard, Ronald F Broom, Paul A Midgley, Alan C Robins, David W Smith, Jeff J Gronsky, Paul E Fischione
Published online by Cambridge University Press:

01 August 2004, pp. 1012-1013
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Micro X-ray Techniques: New Compositional and Structural Characterization Tools

Research Article

Quantitative X-ray Mapping and Spectrum Imaging
John J Friel
Published online by Cambridge University Press:

01 August 2004, pp. 1014-1015
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Cryo X-ray Tomography: New Tool for 3-D Imaging of Biological Specimens at better than 50 nm Resolution
Mark A Le Gros, Carolyn A Larabell
Published online by Cambridge University Press:

01 August 2004, pp. 1016-1017
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Scanning Transmission X-ray Microscopes at the Advanced Light Source: Performance and Experimental Capabilities
Tolek Tyliszczak, A. L. David Kilcoyne, J. Alexander Liddle, Tony Warwick, Adam P. Hitchcock, Harald Ade, David K. Shuh
Published online by Cambridge University Press:

01 August 2004, pp. 1018-1019
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

X-ray Linear Dichroism Microscopy of Crystalline Short Chain Alkanes and Semi-crystalline Polyethylene Thin Films
Harald Ade, Ying Zou, A.D.L. Kilcoyne, Yantian Wang, Miriam Rafailovich, J. Sokolov
Published online by Cambridge University Press:

01 August 2004, pp. 1020-1021
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

The Polychromatic 3D X-ray Microscope: A New Tool for Materials Characterization
Gene E. Ice, Bennett C. Larson
Published online by Cambridge University Press:

01 August 2004, pp. 1022-1023
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

White Beam X-ray Microdiffraction Analysis of Polycrystalline Thin Films
G. S. Cargill
Published online by Cambridge University Press:

01 August 2004, pp. 1024-1025
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Spectrum Imaging and Automation for Comprehensive Specimen Surveys
Peter J Statham
Published online by Cambridge University Press:

01 August 2004, pp. 1026-1027
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Trace Element Imaging and Analysis in Biological Cells with Scanning X-ray Fluorescence Microscopy
Stefan Vogt, Joerg Maser, Tatjana Paunesku, Natasa Stojičevič, Barry Lai, Gayle E Woloschak
Published online by Cambridge University Press:

01 August 2004, pp. 1028-1029
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

3D Elemental Mapping Using a Dedicated FIB/STEM System
Toshie Yaguchi, Mitsuru Konno, Takeo Kamino, Takahito Hashimoto, Tsuyoshi Ohnishi, Masashi Watanabe
Published online by Cambridge University Press:

01 August 2004, pp. 1030-1031
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

X-Ray Spectromicroscopy Studies in Environmental Sciences
J. Thieme, Claudia Schmidt, Peter Guttmann, J. Prietzel, Ingrid Kögel-Knabner
Published online by Cambridge University Press:

01 August 2004, pp. 1032-1033
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Simultaneous Amplitude and Phase Contrast Imaging with a Segmented Detector in Scanning Transmission X-ray Microscopy
Benjamin Hornberger, Chris Jacobsen, Michael Feser
Published online by Cambridge University Press:

01 August 2004, pp. 1034-1035
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

3-D X-ray Microscopy using a Laboratory Source
Michael Feser, Fred Duewer, Steve Wang, David Scott, Alan Lyon, Wenbing Yun
Published online by Cambridge University Press:

01 August 2004, pp. 1036-1037
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Application of Full-Field X-ray Diffraction Microscopy in Biological and Material Science
Yong S Chu, Andrei Tkachuk, Bary Lai, Zhengwei W Hu, Andreas Menzel, Hoydoo You
Published online by Cambridge University Press:

01 August 2004, pp. 1038-1039
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Improvements of Elemental Mapping via X-ray Spectrum Imaging Combined with Principal Component Analysis and Zero-Peak Deconvolution
M. Watanabe, D.B. Williams
Published online by Cambridge University Press:

01 August 2004, pp. 1040-1041
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Page 34 of 48

Microscopy and Microanalysis

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Volume 10 - August 2004

Aberration Correction, Electron Holography, High-Resolution TEM

Research Article

A Standard for Sub-Ångstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes

Cs Corrector for Illumination

Possibility of Cs-Corrected High-Resolution Electron Microscopy of CTF of cosχ for Silicon Crystals

Confocal Electron Holography

The Prospect of Three-Dimensional Induction Mapping Inside Magnetic Nanostructures by Combining Electron Holography with Electron Tomography

An Ultra-High-Tilt Two-Contact Electrical Biasing Specimen Holder for Electron Holography and Electron Tomography of Semiconductor Devices

Micro X-ray Techniques: New Compositional and Structural Characterization Tools

Research Article

Quantitative X-ray Mapping and Spectrum Imaging

Cryo X-ray Tomography: New Tool for 3-D Imaging of Biological Specimens at better than 50 nm Resolution

Scanning Transmission X-ray Microscopes at the Advanced Light Source: Performance and Experimental Capabilities

X-ray Linear Dichroism Microscopy of Crystalline Short Chain Alkanes and Semi-crystalline Polyethylene Thin Films

The Polychromatic 3D X-ray Microscope: A New Tool for Materials Characterization

White Beam X-ray Microdiffraction Analysis of Polycrystalline Thin Films

Spectrum Imaging and Automation for Comprehensive Specimen Surveys

Trace Element Imaging and Analysis in Biological Cells with Scanning X-ray Fluorescence Microscopy

3D Elemental Mapping Using a Dedicated FIB/STEM System

X-Ray Spectromicroscopy Studies in Environmental Sciences

Simultaneous Amplitude and Phase Contrast Imaging with a Segmented Detector in Scanning Transmission X-ray Microscopy

3-D X-ray Microscopy using a Laboratory Source

Application of Full-Field X-ray Diffraction Microscopy in Biological and Material Science

Improvements of Elemental Mapping via X-ray Spectrum Imaging Combined with Principal Component Analysis and Zero-Peak Deconvolution

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 10 - August 2004

Aberration Correction, Electron Holography, High-Resolution TEM

Research Article

Micro X-ray Techniques: New Compositional and Structural Characterization Tools

Research Article