Microscopy and Microanalysis: Volume 10 -

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Volume 10 - August 2004

Contents

Page 37 of 48

Focused Ion Beam (FIB) / Dual Beam Applications and Techniques in Biological and Physical Sciences

Research Article

Effects of Water Vapour on Electron and Ion Beam Deposited Platinum
Richard M Langford, Dogan Ozkaya, J Sheridan, Richard Chater
Published online by Cambridge University Press:

01 August 2004, pp. 1122-1123
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Site-specific 3D Imaging of Cells and Tissues Using DualBeam Technology
Ingo Gestmann, Mike Hayles, Dan Shi, Ganesh Kumar, Lucille A Giannuzzi, Ben Lich, Sriram Subramaniam
Published online by Cambridge University Press:

01 August 2004, pp. 1124-1125
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Fabrication and Characterization of Micron-Sized Compression Samples using a Focused Ion Beam Microscope
Michael D Uchic, Robert Wheeler IV, Michael J Seekely, Dennis M Dimiduk
Published online by Cambridge University Press:

01 August 2004, pp. 1126-1127
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

3D Materials Characterization using Dual-Beam FIB/SEM Techniques
E Lee, R Williams, G B Viswanathan, R Banerjee, H L Fraser
Published online by Cambridge University Press:

01 August 2004, pp. 1128-1129
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

FIB Preparation of Samples for EBSD: Applications to Wear Studies of MEMS Materials
Joseph R Michael, S. V. Prasad
Published online by Cambridge University Press:

01 August 2004, pp. 1130-1131
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Tomographic Spectral Imaging with a Dual-Beam FIB/SEM: 3D Microanalysis
Paul G. Kotula, Michael R. Keenan, Joseph R. Michael
Published online by Cambridge University Press:

01 August 2004, pp. 1132-1133
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Considerations for Three Dimensional Imaging In the Crossbeam FIB
Eric Lifshin, Edward L. Principe, James Evertsen, Art Dewey, Peter Gnauck, John Friel
Published online by Cambridge University Press:

01 August 2004, pp. 1134-1135
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Augmenting the 3D Characterization Capability of the Dual Beam FIB-SEM
Michael D Uchic, Michael Groeber, Robert Wheeler IV, Frank Scheltens, Dennis M Dimiduk
Published online by Cambridge University Press:

01 August 2004, pp. 1136-1137
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Three-Dimensional (3D) Reconstruction of AlFeSi Intermetallic Particles in 6xxx Aluminum Alloys Using the Focused Ion Beam (FIB)
Steven R Claves, Alexander R Bandar, Wojciech Z Misiolek, Joseph R Michael
Published online by Cambridge University Press:

01 August 2004, pp. 1138-1139
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Characterization of Intergranular Fracture Surfaces in a Ni-Cr-Fe Alloy using SEM, FIB and AEM Techniques
M. G. Burke, W. C. Moshier, G. J. C. Carpenter, M. W. Phaneuf
Published online by Cambridge University Press:

01 August 2004, pp. 1140-1141
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

FIB Preparation for HRTEM: GaN Based Devices
Joerg Ralf Jinschek, Velimir R Radmilovic, Christian Kisielowski
Published online by Cambridge University Press:

01 August 2004, pp. 1142-1143
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

FIB Prepared TEM Sample Lift-out Using MEMS Grippers
Kimberly Tuck, Matthew Ellis, Aaron Geisberger, George Skidmore, Phil Foster
Published online by Cambridge University Press:

01 August 2004, pp. 1144-1145
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Having Your Cake and Eating It Too: A Procedure for Obtaining Plan View and Cross Section TEM Images from the Same Site
R. B. Irwin, A. Anciso, P.J. Jones, C. Patton
Published online by Cambridge University Press:

01 August 2004, pp. 1146-1147
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

TEM Annular Objective Apertures Fabricated by FIB
Sara Bals, Velimir R Radmilovic, Christian Kisielowski
Published online by Cambridge University Press:

01 August 2004, pp. 1148-1149
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Site-Specific FIB Preparation of Atom Probe Samples
Hendrik O. Colijn, Thomas F. Kelly, R. M. Ulfig, Rudolf G. Buchheit
Published online by Cambridge University Press:

01 August 2004, pp. 1150-1151
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Application of the CrossBeam Technology to TEM Sample Preparation and Nanolithography
Peter Gnauck, Ulrike Zeile
Published online by Cambridge University Press:

01 August 2004, pp. 1152-1153
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

DualBeam Milling and Deposition of Complex Structures Using Bitmap Files and Digital Patterning
Paul A Anzalone, John F Mansfield, Lucille A Giannuzzi
Published online by Cambridge University Press:

01 August 2004, pp. 1154-1155
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

3D Microscopy and Microanalysis of Au-Al Ultrasonic Bonds by Specific Ion Beam Processing Steps and Scanning Electron Microscopy
Wolfgang Hauffe, Andrzej Bochenek, Marian Lukaszewicz, Enrico Langer, R. J. Mitro
Published online by Cambridge University Press:

01 August 2004, pp. 1156-1157
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

TEM Study of Surface Damage and Profile of a FIB-Prepared Si Sample
Shixin X Wang
Published online by Cambridge University Press:

01 August 2004, pp. 1158-1159
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

TEM Specimen Preparation of Thin Interfacial Coatings on Continuous Ceramic Fibers Using the Focused Ion Beam (FIB) Technique
Dorothy W. Coffey, Karren L. More, Tracie Brummett
Published online by Cambridge University Press:

01 August 2004, pp. 1160-1161
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Page 37 of 48

Microscopy and Microanalysis

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Volume 10 - August 2004

Focused Ion Beam (FIB) / Dual Beam Applications and Techniques in Biological and Physical Sciences

Research Article

Effects of Water Vapour on Electron and Ion Beam Deposited Platinum

Site-specific 3D Imaging of Cells and Tissues Using DualBeam Technology

Fabrication and Characterization of Micron-Sized Compression Samples using a Focused Ion Beam Microscope

3D Materials Characterization using Dual-Beam FIB/SEM Techniques

FIB Preparation of Samples for EBSD: Applications to Wear Studies of MEMS Materials

Tomographic Spectral Imaging with a Dual-Beam FIB/SEM: 3D Microanalysis

Considerations for Three Dimensional Imaging In the Crossbeam FIB

Augmenting the 3D Characterization Capability of the Dual Beam FIB-SEM

Three-Dimensional (3D) Reconstruction of AlFeSi Intermetallic Particles in 6xxx Aluminum Alloys Using the Focused Ion Beam (FIB)

Characterization of Intergranular Fracture Surfaces in a Ni-Cr-Fe Alloy using SEM, FIB and AEM Techniques

FIB Preparation for HRTEM: GaN Based Devices

FIB Prepared TEM Sample Lift-out Using MEMS Grippers

Having Your Cake and Eating It Too: A Procedure for Obtaining Plan View and Cross Section TEM Images from the Same Site

TEM Annular Objective Apertures Fabricated by FIB

Site-Specific FIB Preparation of Atom Probe Samples

Application of the CrossBeam Technology to TEM Sample Preparation and Nanolithography

DualBeam Milling and Deposition of Complex Structures Using Bitmap Files and Digital Patterning

3D Microscopy and Microanalysis of Au-Al Ultrasonic Bonds by Specific Ion Beam Processing Steps and Scanning Electron Microscopy

TEM Study of Surface Damage and Profile of a FIB-Prepared Si Sample

TEM Specimen Preparation of Thin Interfacial Coatings on Continuous Ceramic Fibers Using the Focused Ion Beam (FIB) Technique

Microscopy and Microanalysis

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Volume 10 - August 2004

Focused Ion Beam (FIB) / Dual Beam Applications and Techniques in Biological and Physical Sciences

Research Article