Microscopy and Microanalysis: Volume 10 -

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Volume 10 - August 2004

Contents

Page 36 of 48

Scanned Probe Microscopy: Probing Surfaces at the Nanoscale

Research Article

Characterization of Molecular QCA Cells by Q-Controlled Enhanced Amplitude Modulation Atomic Force Microscopy
Ida Lee, V. Sarveswaran, M. Lieberman, E. Greenbaum
Published online by Cambridge University Press:

01 August 2004, pp. 1082-1083
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Morphology/Mechanical Property Correlations in Multiphase Polyolefin Blends: An Atomic Force Microscopy Study
Francis M Mirabella
Published online by Cambridge University Press:

01 August 2004, pp. 1084-1085
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Nanomechanical Properties of Surfaces and Interfaces of Polycarbonate Systems
J Juliani , Dehua Yang, T.J. Wyrobek
Published online by Cambridge University Press:

01 August 2004, pp. 1086-1087
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Artifacts in the Measurements of Surface Mechanical Properties
Mark R VanLandingham
Published online by Cambridge University Press:

01 August 2004, pp. 1088-1089
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

More Than a Surface Probe: Investigation of Subsurface Charging in Buried Oxide Layers in Silicon Using Kelvin Probe Microscopy
Marion A. Stevens-Kalceff
Published online by Cambridge University Press:

01 August 2004, pp. 1090-1091
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Forces in Biology and Atomic Force Microscopy (AFM) Imaging: Pull and See This!
Irene Revenko, Roger Proksch, Deron Walters
Published online by Cambridge University Press:

01 August 2004, pp. 1092-1093
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Atomic Force Microscopy (AFM) Imaging and Force Recognition at the Molecular Level in Bacteria
David P. Allison, Claretta J. Sullivan , Jennifer L. Morrell, Peter R. Hoyt, Mitchel J. Doktycz
Published online by Cambridge University Press:

01 August 2004, pp. 1094-1095
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Single Molecule Mechanical Testing of Mimetic-Elastin Molecules
Jaimie R. Anderson, Vincent P. Conticello, Lawrence A. Bottomley
Published online by Cambridge University Press:

01 August 2004, pp. 1096-1097
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

In Situ Observation of Freeze Fractured Red Blood Cells with a High-Vacuum Low-Temperature Atomic Force Microscope
Charles B Mooney, Keiichi Nakamoto, Shin-ichi Kitamura
Published online by Cambridge University Press:

01 August 2004, pp. 1098-1099
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

NSOM: Current Technology, Instrumentation and Applications
Klaus Weishaupt, Olaf Hollricher
Published online by Cambridge University Press:

01 August 2004, pp. 1100-1101
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Characterization of the Electrical Properties of Nickel-Based CMSX-4 Super-alloys Using Atomic Force Microscopy (AFM)
Guangchun Cui, Rosario A Gerhardt
Published online by Cambridge University Press:

01 August 2004, pp. 1102-1103
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Development of an Integrated Near-Field Acoustic Holography (NFAH) System on a Scanning Probe Microscopy Platform
Gajendra Shekhawat, Vinayak P Dravid
Published online by Cambridge University Press:

01 August 2004, pp. 1104-1105
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

A Wide Area Scanning Atomic Force Profiler
A D Batchelor, Brian Galhouse, Dieter P Griffis, Fred A Stevie, Phillip E Russell
Published online by Cambridge University Press:

01 August 2004, pp. 1106-1107
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Combinatorial and High Throughput Microscopy for Thin Film Research
Duangrut Julthongpiput, Wenhua Zhang, Michael J Fasolka
Published online by Cambridge University Press:

01 August 2004, pp. 1108-1109
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

"Holes" on Red Blood Cell Membranes Including Thalassemia Imaged by Atomic Force Microscopy
TAPAN Guha, RADHABALLAV Bhar, KAJAL Bhattacharyya, RATANLAL L Brahmachary
Published online by Cambridge University Press:

01 August 2004, pp. 1110-1111
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

In Situ Electrical Probing by TEM-STM: Instrumentation and Applications for Nanocharacterization
Christële M Grimaud, Oleg R Lourie
Published online by Cambridge University Press:

01 August 2004, pp. 1112-1113
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Focused Ion Beam (FIB) / Dual Beam Applications and Techniques in Biological and Physical Sciences

Research Article

Focused Ion Beam Microscopy of Oxide Dispersion Strengthened Molybdenum
R. Baranwal, M. G. Burke, M. W. Phaneuf
Published online by Cambridge University Press:

01 August 2004, pp. 1114-1115
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Mitigation of Localized Charging Induced in Insulating Materials by a Focused Ion Beam
Marion A. Stevens-Kalceff, Katie J. Levick
Published online by Cambridge University Press:

01 August 2004, pp. 1116-1117
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Nanoscale Holes Formed by In Situ Thin Film Deposition in a FIB
Andrew M Minor, Francis Allen, Velimir R Radmilovic, Eric A Stach, Thomas Schenkel
Published online by Cambridge University Press:

01 August 2004, pp. 1118-1119
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Additive Nanopatterning by Platinum Deposition in a Dual Beam FIB
Vidyut Gopal, Eric A Stach, Velimir R Radmilovic
Published online by Cambridge University Press:

01 August 2004, pp. 1120-1121
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Page 36 of 48

Microscopy and Microanalysis

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Volume 10 - August 2004

Scanned Probe Microscopy: Probing Surfaces at the Nanoscale

Research Article

Characterization of Molecular QCA Cells by Q-Controlled Enhanced Amplitude Modulation Atomic Force Microscopy

Morphology/Mechanical Property Correlations in Multiphase Polyolefin Blends: An Atomic Force Microscopy Study

Nanomechanical Properties of Surfaces and Interfaces of Polycarbonate Systems

Artifacts in the Measurements of Surface Mechanical Properties

More Than a Surface Probe: Investigation of Subsurface Charging in Buried Oxide Layers in Silicon Using Kelvin Probe Microscopy

Forces in Biology and Atomic Force Microscopy (AFM) Imaging: Pull and See This!

Atomic Force Microscopy (AFM) Imaging and Force Recognition at the Molecular Level in Bacteria

Single Molecule Mechanical Testing of Mimetic-Elastin Molecules

In Situ Observation of Freeze Fractured Red Blood Cells with a High-Vacuum Low-Temperature Atomic Force Microscope

NSOM: Current Technology, Instrumentation and Applications

Characterization of the Electrical Properties of Nickel-Based CMSX-4 Super-alloys Using Atomic Force Microscopy (AFM)

Development of an Integrated Near-Field Acoustic Holography (NFAH) System on a Scanning Probe Microscopy Platform

A Wide Area Scanning Atomic Force Profiler

Combinatorial and High Throughput Microscopy for Thin Film Research

"Holes" on Red Blood Cell Membranes Including Thalassemia Imaged by Atomic Force Microscopy

In Situ Electrical Probing by TEM-STM: Instrumentation and Applications for Nanocharacterization

Focused Ion Beam (FIB) / Dual Beam Applications and Techniques in Biological and Physical Sciences

Research Article

Focused Ion Beam Microscopy of Oxide Dispersion Strengthened Molybdenum

Mitigation of Localized Charging Induced in Insulating Materials by a Focused Ion Beam

Nanoscale Holes Formed by In Situ Thin Film Deposition in a FIB

Additive Nanopatterning by Platinum Deposition in a Dual Beam FIB

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 10 - August 2004

Scanned Probe Microscopy: Probing Surfaces at the Nanoscale

Research Article

Focused Ion Beam (FIB) / Dual Beam Applications and Techniques in Biological and Physical Sciences

Research Article