Microscopy and Microanalysis: Volume 10 -

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Volume 10 - August 2004

Contents

Page 33 of 48

Accessorizing the SEM

Research Article

Nanomanipulation of Individual Carbon Nanotubes
Rishi Gupta, Taylor M. Cavanah, Marc in het Panhuis
Published online by Cambridge University Press:

01 August 2004, pp. 962-963
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Improved Carbon Analysis with Evactron Plasma Cleaning
Pierre Rolland, Vincent Carlino, Ronald Vane
Published online by Cambridge University Press:

01 August 2004, pp. 964-965
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

A Study of the Effects of Evactron® Plasma Cleaning on X-ray Windows
Ronald Vane , Christine Roberts, Vincent Carlino
Published online by Cambridge University Press:

01 August 2004, pp. 966-967
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

RIMAPS and Variogram Analyses of Microwear Traces in Experiments with Stone Tools
Eduardo Alfredo Favret, Nestor Osvaldo Fuentes, Myrian Rosa Alvarez
Published online by Cambridge University Press:

01 August 2004, pp. 968-969
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Improvements for HR- and Cryo-SEM by the VCT 100 High-Vacuum Cryo Transfer System and SEM Cooling Stage
R. Wepf, T. Richter, M. Sattler, A. Kaech
Published online by Cambridge University Press:

01 August 2004, pp. 970-971
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Aberration Correction, Electron Holography, High-Resolution TEM

Research Article

Seeing Atoms at Sub-Ångstrom Resolution with Aberration-Corrected TEM
Michael A. O'Keefe
Published online by Cambridge University Press:

01 August 2004, pp. 972-973
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

The Weak Phase Object Approximation: From Small Diffraction Angles In Electron Microscopy To Large Angles In Light Optics
Edgar Voelkl
Published online by Cambridge University Press:

01 August 2004, pp. 974-975
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Cs Corrector for Imaging
Hidetaka Sawada, Takeshi Tomita, Toshikatsu Kaneyama, Fumio Hosokawa, Mikio Naruse, Toshikazu Honda, Peter Hartel, Max Haider, Nobuo Tanaka, Crispin J D Hetherington, Ron C Doole, Angus I Kirkland, John L Hutchison, John M Titchmarsh, David J H Cockayne
Published online by Cambridge University Press:

01 August 2004, pp. 976-977
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

First Experimental Proof of Spatial Resolution Improvement in a Monochromized and Cs-Corrected TEM
Bert Freitag, Stephan Kujawa, Peter M. Mul, Peter C. Tiemeijer, Etienne Snoeck
Published online by Cambridge University Press:

01 August 2004, pp. 978-979
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

The Error of Aberration Measurements in HRTEM Using Zemlin Tableaus
Markus Lentzen, Andreas Thust, Knut Urban
Published online by Cambridge University Press:

01 August 2004, pp. 980-981
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

First Cross-Sectional Observation of Oxygen Atoms at (100) Surfaces of Magnesium Oxide by Cs-Corrected TEM
Nobuo Tanaka, Jun Yamasaki, Tomoyuki Kawai
Published online by Cambridge University Press:

01 August 2004, pp. 982-983
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Residual Crystal Tilt Analysis Using High-Resolution Electron Holography
Michael Lehmann
Published online by Cambridge University Press:

01 August 2004, pp. 984-985
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Double-Biprism Electron Holography and Its Applications
Ken Harada, Yoshihiko Togawa, Tetsuya Akashi, Tsuyoshi Matsuda, Akira Tonomura
Published online by Cambridge University Press:

01 August 2004, pp. 986-987
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Electron Beam Induced Charging of Focused Ion Beam Milled Semiconductor Transistors Examined Using Electron Holography
Takeshi Kasama, Rafal E Dunin-Borkowski, Simon B Newcomb, Martha R McCartney
Published online by Cambridge University Press:

01 August 2004, pp. 988-989
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Interference of Elastically and Inelastically Scattered Electrons by DBI/H
Rodney A Herring
Published online by Cambridge University Press:

01 August 2004, pp. 990-991
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

HRTEM Study of a New Non-Stoichiometric BaTiO(3-δ) Structure
G. Y. Yang, E. C. Dickey, C. A. Randall, D. I. Woodward, I. M. Reaney
Published online by Cambridge University Press:

01 August 2004, pp. 992-993
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Observation of Point Defect in Silicon using HRTEM
Sung Il Baik, Hee-Suk Chung, Jian-Min Zuo, Young-Woon Kim
Published online by Cambridge University Press:

01 August 2004, pp. 994-995
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Observation of Si Nanocrystals by Spherical-Aberration Corrected Transmission Electron Microscopy
Christopher R Perrey, Julia M Deneen, Siri S Thompson, Markus Lentzen, Uwe Kortshagen, C. Barry Carter
Published online by Cambridge University Press:

01 August 2004, pp. 996-997
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Direct Imaging of the InSb(111)B-2x2 Surface by HR Profile-TEM Technique
T.D. Mishima, N. Naruse, T. Osaka
Published online by Cambridge University Press:

01 August 2004, pp. 998-999
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Web-Based Electron Microscopy Application Software: Web-EMAPS
J. M. Zuo, J. C. Mabon
Published online by Cambridge University Press:

01 August 2004, pp. 1000-1001
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Page 33 of 48

Microscopy and Microanalysis

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Volume 10 - August 2004

Accessorizing the SEM

Research Article

Nanomanipulation of Individual Carbon Nanotubes

Improved Carbon Analysis with Evactron Plasma Cleaning

A Study of the Effects of Evactron® Plasma Cleaning on X-ray Windows

RIMAPS and Variogram Analyses of Microwear Traces in Experiments with Stone Tools

Improvements for HR- and Cryo-SEM by the VCT 100 High-Vacuum Cryo Transfer System and SEM Cooling Stage

Aberration Correction, Electron Holography, High-Resolution TEM

Research Article

Seeing Atoms at Sub-Ångstrom Resolution with Aberration-Corrected TEM

The Weak Phase Object Approximation: From Small Diffraction Angles In Electron Microscopy To Large Angles In Light Optics

Cs Corrector for Imaging

First Experimental Proof of Spatial Resolution Improvement in a Monochromized and Cs-Corrected TEM

The Error of Aberration Measurements in HRTEM Using Zemlin Tableaus

First Cross-Sectional Observation of Oxygen Atoms at (100) Surfaces of Magnesium Oxide by Cs-Corrected TEM

Residual Crystal Tilt Analysis Using High-Resolution Electron Holography

Double-Biprism Electron Holography and Its Applications

Electron Beam Induced Charging of Focused Ion Beam Milled Semiconductor Transistors Examined Using Electron Holography

Interference of Elastically and Inelastically Scattered Electrons by DBI/H

HRTEM Study of a New Non-Stoichiometric BaTiO(3-δ) Structure

Observation of Point Defect in Silicon using HRTEM

Observation of Si Nanocrystals by Spherical-Aberration Corrected Transmission Electron Microscopy

Direct Imaging of the InSb(111)B-2x2 Surface by HR Profile-TEM Technique

Web-Based Electron Microscopy Application Software: Web-EMAPS

Microscopy and Microanalysis

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Volume 10 - August 2004

Accessorizing the SEM

Research Article

Aberration Correction, Electron Holography, High-Resolution TEM

Research Article