Microscopy and Microanalysis: Volume 10 -

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Volume 10 - August 2004

Contents

Page 32 of 48

Quantitative X-ray Microanalysis

Research Article

Monte Carlo Simulation of EDS X-Ray Spectra
Raynald Gauvin
Published online by Cambridge University Press:

01 August 2004, pp. 922-923
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Light Rejection Evaluation of Ultrathin Polymer EDS Windows
M C Roberts, Eric C Anderson
Published online by Cambridge University Press:

01 August 2004, pp. 924-925
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

A New NIST SRM® for Microanalysis and X-ray Fluorescence, TiAl(NbW) Alloy
Ryna B Marinenko, John R Sieber, Lee L Yu, Therese A Butler, Stefan Leigh
Published online by Cambridge University Press:

01 August 2004, pp. 926-927
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Development of Microanalytical Reference Materials for Geochemical Analysis
Stephen A Wilson, Phil A Potts
Published online by Cambridge University Press:

01 August 2004, pp. 928-929
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Accessorizing the SEM

Research Article

The Structural and Chemical Analyzer (SCA): A New Analytical Technique for SEM
Tim Prusnick, A. D. Brooker, Robert Bennett
Published online by Cambridge University Press:

01 August 2004, pp. 930-931
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

A Structural and Chemical Analyser (SCA) Identification of Bacteria Labelled by Metallic Nanoparticles
Alan Derek Brooker, R M Jarvis, Royston Goodacre, Robert Bennett, C J Dawe, D J Leak, M J Lainchbury, M R Hill
Published online by Cambridge University Press:

01 August 2004, pp. 932-933
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Random Probability Calculations in Texture Measurements
Cheng Tsien Chou
Published online by Cambridge University Press:

01 August 2004, pp. 934-935
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

EBSD - Current Achievements in Speed and Resolution
T M Maitland
Published online by Cambridge University Press:

01 August 2004, pp. 936-937
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

An Energy Filter for Electron Backscattering Diffraction
T K Hooghan, Philippe Staib, Alwyn Eades
Published online by Cambridge University Press:

01 August 2004, pp. 938-939
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Monte Carlo Simulation for Electron Backscattering Diffraction
Xiaodong Tao, Alwyn Eades
Published online by Cambridge University Press:

01 August 2004, pp. 940-941
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Properties and Applications of New Silicon Drift Detectors and Multiple Element Silicon Drift Detectors
Ralf Terborg, Martin Rohde
Published online by Cambridge University Press:

01 August 2004, pp. 942-943
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Spectrum Image Mapping with a Silicon Drift Detector (SDD) in an SEM
D E Newbury, J A Small, David Bright, Jan S Iwanczyk, Shaul Barkan, J F Thiot
Published online by Cambridge University Press:

01 August 2004, pp. 944-945
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Nanorobots for the SEM
Stephan Kleindiek
Published online by Cambridge University Press:

01 August 2004, pp. 946-947
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

World Trade Center Particulate Contamination Signature
S R Badger, K P Rickabaugh, M S Potter, B E Scheetz, H R Bhattacharjee, R J Lee
Published online by Cambridge University Press:

01 August 2004, pp. 948-949
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

SE and BSE Information from CNT Containing Fe at Various Accelerating Voltages
Shuichi Takeuchi, Atsushi Muto, Mine Nakagawa, Sara White, Ryuichiro Tamochi, Mitsugu Sato, Mitsuhiko Yamada, David C Joy
Published online by Cambridge University Press:

01 August 2004, pp. 950-951
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

The Aberration-corrected SEM - the Ultimate Accessory?
D C Joy
Published online by Cambridge University Press:

01 August 2004, pp. 952-953
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Electron Microscopy of Wet Samples from Cells and Tissues to Food, Cosmetics and Medical Devices
Ory Zik , Vered Behar, Amotz Nechushtan
Published online by Cambridge University Press:

01 August 2004, pp. 954-955
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

New Ion Beam Milling System for Fast and Efficient Site Specific Sample Preparation
Astrid Krehan, Alex Vogt, W Gruenewald
Published online by Cambridge University Press:

01 August 2004, pp. 956-957
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Material Analysis Using SEM/EDS Combined with a Raman Spectrometer
Kazuteru Kawauchi, Kazumichi Ogura, Charlie Nielsen, Alan D Brooker, Robert Bennett
Published online by Cambridge University Press:

01 August 2004, pp. 958-959
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Identification and Quantification of Topologically Close Packed Phases (TCP) in Alloy 22 Using Electron Backscatter Diffraction (EBSD) Analysis
Bassem S El-Dasher, Sharon G Torres, Tammy S Summers
Published online by Cambridge University Press:

01 August 2004, pp. 960-961
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Page 32 of 48

Microscopy and Microanalysis

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Volume 10 - August 2004

Quantitative X-ray Microanalysis

Research Article

Monte Carlo Simulation of EDS X-Ray Spectra

Light Rejection Evaluation of Ultrathin Polymer EDS Windows

A New NIST SRM® for Microanalysis and X-ray Fluorescence, TiAl(NbW) Alloy

Development of Microanalytical Reference Materials for Geochemical Analysis

Accessorizing the SEM

Research Article

The Structural and Chemical Analyzer (SCA): A New Analytical Technique for SEM

A Structural and Chemical Analyser (SCA) Identification of Bacteria Labelled by Metallic Nanoparticles

Random Probability Calculations in Texture Measurements

EBSD - Current Achievements in Speed and Resolution

An Energy Filter for Electron Backscattering Diffraction

Monte Carlo Simulation for Electron Backscattering Diffraction

Properties and Applications of New Silicon Drift Detectors and Multiple Element Silicon Drift Detectors

Spectrum Image Mapping with a Silicon Drift Detector (SDD) in an SEM

Nanorobots for the SEM

World Trade Center Particulate Contamination Signature

SE and BSE Information from CNT Containing Fe at Various Accelerating Voltages

The Aberration-corrected SEM - the Ultimate Accessory?

Electron Microscopy of Wet Samples from Cells and Tissues to Food, Cosmetics and Medical Devices

New Ion Beam Milling System for Fast and Efficient Site Specific Sample Preparation

Material Analysis Using SEM/EDS Combined with a Raman Spectrometer

Identification and Quantification of Topologically Close Packed Phases (TCP) in Alloy 22 Using Electron Backscatter Diffraction (EBSD) Analysis

Microscopy and Microanalysis

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Volume 10 - August 2004

Quantitative X-ray Microanalysis

Research Article

Accessorizing the SEM

Research Article