Microscopy and Microanalysis: Volume 10 -

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Volume 10 - August 2004

Contents

Page 35 of 48

Micro X-ray Techniques: New Compositional and Structural Characterization Tools

Research Article

Peak Shifts in the NIST Microcalorimeter X-ray Detector
Terrance Jach, John A Small, Dale E Newbury, Lance R King
Published online by Cambridge University Press:

01 August 2004, pp. 1042-1043
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

A High Energy-resolution Wavelength-dispersive Soft-X-ray Spectrometer for a Transmission Electron Microscope to Investigate Valence Electrons
Masami Terauchi
Published online by Cambridge University Press:

01 August 2004, pp. 1044-1045
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Silicon Drift Detectors for Fast and High Resolution Element Detection in Micro-Beam Analysis
Heike Soltau, Peter Lechner, Gerhard Lutz, Lothar Strüder, Carlo Fiorini , Antonio Longoni, Rouven Eckhard, Andreas Pahlke, Martina Schnecke, Gerhard Schaller, Florian Schopper
Published online by Cambridge University Press:

01 August 2004, pp. 1046-1047
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

A New Improved Silicon Multi-Cathode Detector (SMCD) for Microanalysis and X-Ray Mapping Applications
Shaul Barkan, Valeri D Saveliev, Jan S Iwanczyk, Liangyuan Feng, Carolyn R Tull, Bradley E Patt, Dale E Newbury, John A Small
Published online by Cambridge University Press:

01 August 2004, pp. 1048-1049
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Methods and Examples of Quantitative Chemical Mapping using Synchrotron Soft X-ray Spectromicroscopy
Adam P Hitchcock, Cynthia Morin, Li Li, John Brash, Andreas Scholl, Andrew Doran
Published online by Cambridge University Press:

01 August 2004, pp. 1050-1051
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

In-situ Characterization of Dynamic Processes by Variable Pressure Electron Microscopy

Research Article

Environmental Scanning Electron Microscopy on Ultra-thin Films in 2-D and 3-D
R. Leblanc
Published online by Cambridge University Press:

01 August 2004, pp. 1052-1053
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

In situ ESEM Study of Liquid Transport through Carbon Nanopipes
Maria Pia Rossi, Yury Gogotsi
Published online by Cambridge University Press:

01 August 2004, pp. 1054-1055
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

In-Situ Characterization of Micro and Nanoscale Kinetics by Variable Pressure Electron Microscopy I: Quantifying the Environment
Eric Doehne, Tiziana Lombardo
Published online by Cambridge University Press:

01 August 2004, pp. 1056-1057
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

A Two-Stage Gas Amplification Secondary Electron Detector for Ultra-High Resolution Imaging
B L Thiel, Milos Toth, R P M Schroemges, J J Scholtz, Gerard van Veen, W R Knowles
Published online by Cambridge University Press:

01 August 2004, pp. 1058-1059
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Design of a Two-Stage Gas Amplification Secondary Electron Detector for Imaging Insulating Samples at the sub-1 nm Scale
W. Ralph Knowles, B L Thiel, Milos Toth, R P M Schroemges, J J Scholtz, Gerard van Veen, Marcel Elders, A M Donald
Published online by Cambridge University Press:

01 August 2004, pp. 1060-1061
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Secondary Electron Imaging at Gas Pressures in Excess of 15 torr
Milos Toth, F S Baker
Published online by Cambridge University Press:

01 August 2004, pp. 1062-1063
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

In-situ Evaluation of Post Growth Treatments on the Cathodoluminescence Properties of Fluorescent Nano-particles in the Environmental Scanning Electron Microscope
M R Phillips, K E McBean
Published online by Cambridge University Press:

01 August 2004, pp. 1064-1065
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Dynamic Observations of Abnormal Grain-growth Occurring in Barium Titanate During Sintering
Srinivas Subramaniam, R D Roseman
Published online by Cambridge University Press:

01 August 2004, pp. 1066-1067
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Using an Environmental Scanning Electron Microscope to Study Phase Transitions and Chemistries of NaCl/Glutaric Acid Aerosol Particles
R L Schalek, Hui-Ming Hung, S T Martin
Published online by Cambridge University Press:

01 August 2004, pp. 1068-1069
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Observation of Dynamic Phase Transitions and Domain Formations in Electronic Materials by Environmental Scanning Electron Microscopy
Harald Dobberstein
Published online by Cambridge University Press:

01 August 2004, pp. 1070-1071
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Observation of Ferroelectric Domains using Environmental SEM
Wenwu Cao
Published online by Cambridge University Press:

01 August 2004, pp. 1072-1073
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Raising the Pressure: Realizing Room Temperature/High Humidity Applications in ESEM
Debbie J Stokes, Francis S Baker, Milos Toth
Published online by Cambridge University Press:

01 August 2004, pp. 1074-1075
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

A Method for In-situ Mechanical Testing Inside an Environmental SEM Chamber
Nadja Zakowsky, Athene M. Donald, Frank S. Baker
Published online by Cambridge University Press:

01 August 2004, pp. 1076-1077
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Charge Contrast Imaging of the Soft Tissue and Mineralized Skeletal Phases in a Scleractinian Coral
Peta L Clode, Brendan J Griffin
Published online by Cambridge University Press:

01 August 2004, pp. 1078-1079
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Scanned Probe Microscopy: Probing Surfaces at the Nanoscale

Research Article

High-Resolution Atomic Force Microscopy of Organic Materials
Sergei Magonov
Published online by Cambridge University Press:

01 August 2004, pp. 1080-1081
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Page 35 of 48

Microscopy and Microanalysis

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Volume 10 - August 2004

Micro X-ray Techniques: New Compositional and Structural Characterization Tools

Research Article

Peak Shifts in the NIST Microcalorimeter X-ray Detector

A High Energy-resolution Wavelength-dispersive Soft-X-ray Spectrometer for a Transmission Electron Microscope to Investigate Valence Electrons

Silicon Drift Detectors for Fast and High Resolution Element Detection in Micro-Beam Analysis

A New Improved Silicon Multi-Cathode Detector (SMCD) for Microanalysis and X-Ray Mapping Applications

Methods and Examples of Quantitative Chemical Mapping using Synchrotron Soft X-ray Spectromicroscopy

In-situ Characterization of Dynamic Processes by Variable Pressure Electron Microscopy

Research Article

Environmental Scanning Electron Microscopy on Ultra-thin Films in 2-D and 3-D

In situ ESEM Study of Liquid Transport through Carbon Nanopipes

In-Situ Characterization of Micro and Nanoscale Kinetics by Variable Pressure Electron Microscopy I: Quantifying the Environment

A Two-Stage Gas Amplification Secondary Electron Detector for Ultra-High Resolution Imaging

Design of a Two-Stage Gas Amplification Secondary Electron Detector for Imaging Insulating Samples at the sub-1 nm Scale

Secondary Electron Imaging at Gas Pressures in Excess of 15 torr

In-situ Evaluation of Post Growth Treatments on the Cathodoluminescence Properties of Fluorescent Nano-particles in the Environmental Scanning Electron Microscope

Dynamic Observations of Abnormal Grain-growth Occurring in Barium Titanate During Sintering

Using an Environmental Scanning Electron Microscope to Study Phase Transitions and Chemistries of NaCl/Glutaric Acid Aerosol Particles

Observation of Dynamic Phase Transitions and Domain Formations in Electronic Materials by Environmental Scanning Electron Microscopy

Observation of Ferroelectric Domains using Environmental SEM

Raising the Pressure: Realizing Room Temperature/High Humidity Applications in ESEM

A Method for In-situ Mechanical Testing Inside an Environmental SEM Chamber

Charge Contrast Imaging of the Soft Tissue and Mineralized Skeletal Phases in a Scleractinian Coral

Scanned Probe Microscopy: Probing Surfaces at the Nanoscale

Research Article

High-Resolution Atomic Force Microscopy of Organic Materials

Microscopy and Microanalysis

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Volume 10 - August 2004

Micro X-ray Techniques: New Compositional and Structural Characterization Tools

Research Article

In-situ Characterization of Dynamic Processes by Variable Pressure Electron Microscopy

Research Article

Scanned Probe Microscopy: Probing Surfaces at the Nanoscale

Research Article