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Peak Shifts in the NIST Microcalorimeter X-ray Detector

Published online by Cambridge University Press:  01 August 2004

Terrance Jach
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
John A Small
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
Dale E Newbury
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
Lance R King
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Copyright
© 2004 Microscopy Society of America

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