Microscopy and Microanalysis: Volume 10 -

< Back to all issues

Volume 10 - August 2004

Contents

Page 29 of 48

Order in Disorder: Probing the Structure of Amorphous Materials

Research Article

Hydrogen-Induced Reduction in Medium Range Order of a-Si Thin Films Observed using Fluctuation Electron Microscopy
Lakshmi Narayana Nittala, Sreenivas Jayaraman, Brent A Sperling, John R Abelson
Published online by Cambridge University Press:

01 August 2004, pp. 802-803
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Constrained Monte Carlo Approach to Modeling Disordered Materials
Parthapratim Biswas, Raymond Atta-Fynn, David A Drabold
Published online by Cambridge University Press:

01 August 2004, pp. 804-805
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Fluctuation Microscopy with Electrons or X-Rays: Insight into Medium-Range Order
J. M. Gibson, M.M.J. Treacy, L. Fan, I. McNulty, D. Paterson
Published online by Cambridge University Press:

01 August 2004, pp. 806-807
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

An Empirical Approach of Measuring RDF from Electron Diffraction Patterns.
xidong Chen
Published online by Cambridge University Press:

01 August 2004, pp. 808-809
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Understanding Fluctuation Microscopy - A Statistical Theory
xidong Chen
Published online by Cambridge University Press:

01 August 2004, pp. 810-811
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Fluctuation Microscopy Studies of Aluminum Oxides Exposed to Different Electrolytes
xidong Chen, John Sullivan, Charles Barbour, Craig Johnson
Published online by Cambridge University Press:

01 August 2004, pp. 812-813
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Medium-Range Ordering in Amorphous Diamond-like Carbon Films after Thermal Annealing
Xidong Chen, John Sullivan, Tom Friedmann, J. Murray Gibson
Published online by Cambridge University Press:

01 August 2004, pp. 814-815
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

In-Situ STEM Observation of Phase Separation in Ultrathin Ag/Cu Alloy System
Hao Chen, J. M. Zuo
Published online by Cambridge University Press:

01 August 2004, pp. 816-817
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Study of Medium-range Order in Amorphous Carbon by Efficient ab-initio Tight-Binding Technique
K. Kohary, D. Nguyen-Manh, D.J.H. Cockayne, N. Marks, D.G. Pettifor
Published online by Cambridge University Press:

01 August 2004, pp. 818-819
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Evidence from Simulations for Orientational Medium Range Order in Fluctuation-Electron-Microscopy Observations of a-Si
Sanjay V. Khare, Serge M. Nakhmanson, Paul M. Voyles, Pawel Keblinski, John R. Abelson
Published online by Cambridge University Press:

01 August 2004, pp. 820-821
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Electron Energy-Loss and X-ray Absorption Spectroscopies: Focus on Anisotropic Properties

Research Article

Magic Orientation, Magic Angle and Linear Dichroic Spectroscopy of Anisotropic Systems
Jun Yuan, Yukui K Sun, Shangpeng P Gao
Published online by Cambridge University Press:

01 August 2004, pp. 822-823
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Trace Element Chemistry in Spent Nuclear Fuel Using X-ray Absorption Spectroscopy
Jeffrey A. Fortner, A. Jeremy Kropf, Robert J. Finch, James C. Cunnane
Published online by Cambridge University Press:

01 August 2004, pp. 824-825
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Elastic Anomaly for SrTiO3 Thin Films Grown on Si(001)
J.C. Woicik, F.S. Aguirre-Tostado, A. Herrera-Gomez, R. Droopad, Z. Yu, D.G. Schlom, P. Zschack, E. Karapetrova, C.S. Hellberg
Published online by Cambridge University Press:

01 August 2004, pp. 826-827
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

High Spatial Resolution Mapping of the Effective Mass in GaInNAs
Mhairi H Gass, Ana M Sanchez, Adam J Papworth, Tim J Bullough, Paul R Chalker
Published online by Cambridge University Press:

01 August 2004, pp. 828-829
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Soft X-Ray Probes of Anisotropic Behaviour
Sarnjeet S. Dhesi
Published online by Cambridge University Press:

01 August 2004, pp. 830-831
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Loss of Ferromagnetism at the Surface of the Naturally Layered Manganite, La1.2Sr1.8Mn2O7
John W. Freeland, Ken E. Gray, Elvira Badica, Jerald Kavich, John F. Mitchell
Published online by Cambridge University Press:

01 August 2004, pp. 832-833
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Temperature Dependent Magnetic Linear Dichroism by Momentum-Resolved EELS
Yasuo Ito, Yoshie Murooka, Russell E Cook, Michel van Veenendaal, Nanda Menon, Dean J Miller
Published online by Cambridge University Press:

01 August 2004, pp. 834-835
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Observation of Circular Dichroism in the TEM
Peter Schattschneider, Stefano Rubino, Cecile Hebert
Published online by Cambridge University Press:

01 August 2004, pp. 836-837
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Angular-Resolved Electron Energy-Loss Spectroscopy of MgB2-related Compounds
Robert F Klie, Lance D Cooley, Yimei Zhu
Published online by Cambridge University Press:

01 August 2004, pp. 838-839
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Distinguishing Intra-band and Inter-band Transitions in MgB2 Using Monochromated EELS
Juan C Idrobo, Nigel D Browning
Published online by Cambridge University Press:

01 August 2004, pp. 840-841
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Page 29 of 48

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 10 - August 2004

Order in Disorder: Probing the Structure of Amorphous Materials

Research Article

Hydrogen-Induced Reduction in Medium Range Order of a-Si Thin Films Observed using Fluctuation Electron Microscopy

Constrained Monte Carlo Approach to Modeling Disordered Materials

Fluctuation Microscopy with Electrons or X-Rays: Insight into Medium-Range Order

An Empirical Approach of Measuring RDF from Electron Diffraction Patterns.

Understanding Fluctuation Microscopy - A Statistical Theory

Fluctuation Microscopy Studies of Aluminum Oxides Exposed to Different Electrolytes

Medium-Range Ordering in Amorphous Diamond-like Carbon Films after Thermal Annealing

In-Situ STEM Observation of Phase Separation in Ultrathin Ag/Cu Alloy System

Study of Medium-range Order in Amorphous Carbon by Efficient ab-initio Tight-Binding Technique

Evidence from Simulations for Orientational Medium Range Order in Fluctuation-Electron-Microscopy Observations of a-Si

Electron Energy-Loss and X-ray Absorption Spectroscopies: Focus on Anisotropic Properties

Research Article

Magic Orientation, Magic Angle and Linear Dichroic Spectroscopy of Anisotropic Systems

Trace Element Chemistry in Spent Nuclear Fuel Using X-ray Absorption Spectroscopy

Elastic Anomaly for SrTiO3 Thin Films Grown on Si(001)

High Spatial Resolution Mapping of the Effective Mass in GaInNAs

Soft X-Ray Probes of Anisotropic Behaviour

Loss of Ferromagnetism at the Surface of the Naturally Layered Manganite, La1.2Sr1.8Mn2O7

Temperature Dependent Magnetic Linear Dichroism by Momentum-Resolved EELS

Observation of Circular Dichroism in the TEM

Angular-Resolved Electron Energy-Loss Spectroscopy of MgB2-related Compounds

Distinguishing Intra-band and Inter-band Transitions in MgB2 Using Monochromated EELS

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 10 - August 2004

Order in Disorder: Probing the Structure of Amorphous Materials

Research Article

Electron Energy-Loss and X-ray Absorption Spectroscopies: Focus on Anisotropic Properties

Research Article