Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-24T20:40:27.809Z Has data issue: false hasContentIssue false
  • English
  • Français

Hydrogen-Induced Reduction in Medium Range Order of a-Si Thin Films Observed using Fluctuation Electron Microscopy

Published online by Cambridge University Press:  01 August 2004

Lakshmi Narayana Nittala ,
Sreenivas Jayaraman ,
Brent A Sperling  and
John R Abelson
Lakshmi Narayana Nittala
Affiliation:
University of Illinois Urbana-Champaign
Sreenivas Jayaraman
Affiliation:
University of Illinois Urbana-Champaign
Brent A Sperling
Affiliation:
University of Illinois Urbana-Champaign
John R Abelson
Affiliation:
University of Illinois Urbana-Champaign
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 802 - 803
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)