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Possibility of Cs-Corrected High-Resolution Electron Microscopy of CTF of cosχ for Silicon Crystals

Published online by Cambridge University Press:  01 August 2004

Nobuo Tanaka ,
Tomoykui Kawai  and
Jun Yamasaki
Nobuo Tanaka
Affiliation:
Nagoya Univesity, Japan
Tomoykui Kawai
Affiliation:
Nagoya Univesity, Japan
Jun Yamasaki
Affiliation:
Nagoya Univesity, Japan
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 1006 - 1007
Copyright
© 2004 Microscopy Society of America

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