Microscopy and Microanalysis: Volume 26 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - December 2020

Impact of Recent Advancement in Instrumentation/Detectors on Electron Energy Loss Spectroscopy for Physical and Biological Sciences

Multimodal Methods for In Situ Transmission Electron Microscope

New Advances in Stimulated Electron Energy Gain and Loss Spectroscopy

Imaging Nanoscale Optical Fields with Inelastic Electron-light Scattering

Carrier Collective Excitations in Degenerate Semiconductors Studied by EELS

Hybrid Pixel EELS Detector: Low Noise, High Speed, and Large Dynamic Range

Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX

Machine Learning for Sub-pixel Super-resolution in Direct Electron Detectors

Realtime Up-sampling Noise Filter: Paradigm Shift for Data Acquisition

Electron Energy-loss Spectroscopy Using MerlinEM - Medipix3 Detector

Transforming Transmission Electron Microscopy with MerlinEM Electron Counting Detector

Beam Energy Dependent Calibration of STEM and BSE Detectors for Thin Film Thickness Estimation

Direct Phase Imaging with Coherent Electron Beam in TEM

Electron Holography Investigation of Resistive Switching CeO2 / STO Nanocolumns

2D Evaluation of the Potential Difference in an InP Device by Shadow Image Distortion Method

Accurate Measurement of Electric Potential Distributions at the Interfaces in Solids Using Phase-shifting Electron Holography

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Surface Analysis and Spectroscopy III - Applications to Interface Chemistry

Measuring Viscoelastic Master Curves at the Nanoscale in Polymer Composites

High-resolution Viscoelastic Mapping of Cells with FT-NanoDMA Mode of AFM

Nanomechanical Insights into Voxel-scale Photopolymer Cure

Scanning Ion Conductance Microscopy (SICM) for Low-stress Directly Examining of Cellular Mechanics

High-Resolving Power, Multi-Modal and Correlative SIMS Imaging in Biology, Geology and Materials

Magnetic Sector SIMS System with Continuous Focal Plane Detector for Advanced Analytical Capabilities on FIB Instruments

npSCOPE: A New Instrument Combining SIMS Imaging, SE Imaging and Transmission Ion Microscopy for High Resolution In-situ Correlative Investigations

Vendor Symposium - Materials Preparation

LaserFIB – the New All-in-one Tool to Speed up Sample Preparation for APT

Microscopy and Microanalysis

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Volume 26 - December 2020

Impact of Recent Advancement in Instrumentation/Detectors on Electron Energy Loss Spectroscopy for Physical and Biological Sciences

Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX

Direct Phase Imaging with Coherent Electron Beam in TEM

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Surface Analysis and Spectroscopy III - Applications to Interface Chemistry

High-Resolving Power, Multi-Modal and Correlative SIMS Imaging in Biology, Geology and Materials

Vendor Symposium - Materials Preparation