Microscopy and Microanalysis: Volume 26 -

Only show content I have access to (1258)

Only show open access (21)

Over 3 years (1367)

Biological Applications (25)

Plenary Session (2)

Author Index (1)

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 26 - December 2020

In situ TEM at the Extremes - Extreme Temperature and Biasing

Atomic Scale Tracking of a Charge Order Transition with Continuously Variable Temperature Cryo-STEM

In Situ TEM at the Extremes - Liquid environment

In Situ Atomic-scale Observation of Thermal-induced Detwinning in Face-centered Cubic Metals

Approaching Operando Imaging of Functional Materials

Visualizing Chemical Processes in Semiconductors with In Situ TEM

Probing Composition Distribution in Nanoalloy Catalysts with Correlative Electron Microscopy

Self-assembly of Periodical < C >-screw Dislocation Array in Hot-compressed Pure Magnesium

Operando Imaging of Ion Migration in Metal Halide Perovskites

Call of the Wild: Advances in Microanalysis and Microscopy of Geological and Extraterrestrial Materials

Putting Planetary Materials into the Gap: Insights into Planetary and Stellar Processes from in Situ Measurements in the TEM

TEM Structural and Compositional Studies of Presolar SiC Grains and Their Relation to Raman Spectra

A Sintered and Sulfidized Equilibrated Aggregate from an Interplanetary Dust Particle

3D Microstructural and Microanalytical Analyses of Wark-Lovering Rims in the Allende Meteorite

Fast, Computer-Assisted Detection of μm-Scale Dust Impact Craters on Spacecraft Materials

Bridging the Fundamental Electron Dose Gap for Observing Atom Processes in Complex Materials in their Native Environments

Pulsed-Laser-Driven TEM for Studying Temporal Aspects of Beam Damage

Sputtering During Microanalysis in the Analytical Electron Microscope

Soft X-ray Scanning Transmission Microscopy Studies of Radiation Damage by Electron, Ion and X-ray Beams

Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems

An Atom-probe Tomographic Study of Kinetic Pathways of Retention Excesses and Depletions at Gamma(F.C.C.)/gamma-prime (L12) Interfaces in a Ni-Al-Cr-Re Superalloy

Exploration of Novel Ordering Mechanism in Titanium Alloys Using Atom Probe Tomography and Aberration-corrected Scanning Transmission Electron Microscopy

Alpha Shape Analysis: Extracting Composition, Surface Area, and Volume Post Clustering

Silicon-standard-based Comparisons of LEAP Accuracy and Precision

Phase Stability and Microstructural Evolution in Vanadium-Titanium Alloys with Oxygen Dissolution and Varying Titanium-content

Technologists' Forum - Negative Staining of Small Molecules in Non-CryoEM Facilities

Preparation of Liposomes for Negative Staining TEM

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 26 - December 2020

In situ TEM at the Extremes - Extreme Temperature and Biasing

In Situ TEM at the Extremes - Liquid environment

Approaching Operando Imaging of Functional Materials

Call of the Wild: Advances in Microanalysis and Microscopy of Geological and Extraterrestrial Materials

Bridging the Fundamental Electron Dose Gap for Observing Atom Processes in Complex Materials in their Native Environments

Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems

Technologists' Forum - Negative Staining of Small Molecules in Non-CryoEM Facilities