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Sputtering During Microanalysis in the Analytical Electron Microscope

Published online by Cambridge University Press:  30 July 2020

Nestor Zaluzec
Nestor Zaluzec*
Affiliation:
Argonne National Laboratory, Bolingbrook, Illinois, United States

Abstract

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Type
Bridging the Fundamental Electron Dose Gap for Observing Atom Processes in Complex Materials in their Native Environments
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2068 - 2070
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Copyright
Copyright © Microscopy Society of America 2020

References

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This research was supported by the Photon Science Division and employed resources in the Center for Nanoscale Materials, an Office of Science user facility both of the U.S. Department of Energy, Office of Basic Energy Sciences under contract No. DE-AC02- 06CH11357 at Argonne National Laboratory.Google Scholar