Microscopy and Microanalysis: Volume 26 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - December 2020

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

3D Visualization of Nanoscale Tomography Using Holographic Displays

Achieving High-resolution of Large Specimens Using Aberration-corrected Tomography

Approaching Operando Imaging of Functional Materials

In-situ Atomic-scale Imaging of Surface Segregation in Alloys

Direct Insight into the Reactivity of Pt Nanoparticles in CO Oxidation by Operando TEM and the Impact of Electron Dose Rate on Their Coarsening

In-situ and In-operando Cobalt Oxidation Studied by Atom Probe Tomography

Call of the Wild: Advances in Microanalysis and Microscopy of Geological and Extraterrestrial Materials

Quantagenetics® and Machine Learning: A New Paradigm in Material Identification

Including the Oxidation State of Iron to Improve Matrix Corrections in EPMA Analyses

Machine Learning on STEM-EDS Data for Quantifying Overlapping Deep-Mantle Rock Assemblages

New EPMA-XRF Integration Allows Rapid Trace Element Analysis of Geological Materials

Quantification of Bastnaesite and Hydroxylbastnaesite Using Electron Probe Microanalysis and Cathodoluminescence

Technologists' Forum Roundtable: Commercial Technical Careers in Microscopy - No PhD? No Worries

Microscopy Career and How It Defined My Choices

Career Path Under the Lens: From Technician to Technical Specialist

Me, Microscopy and No PhD

Biological Sciences Tutorial: CryoEM Sample Preparation: Problems and Potential Solutions

What's Going On with My CryoEM/CryoFIB-SEM Sample, and How Might I Improve It?

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures

The 4D Camera – An 87 kHz Frame-rate Detector for Counted 4D-STEM Experiments

Comparison of Ptychography vs. Center-of-mass Analysis of Registered 4D-STEM Series

Spatial Frequency Selection in Lorentz 4D-Scanning Transmission Electron Microscopy Reconstruction

Features of Our SEM Transmission Diffraction Sub-stage with 6-axis Sample Control and a Camera with Variable Camera Length

Machine Learning Assisted Pattern Matching: Insight into Oxide Electronic Device Performance by Phase Determination in 4D-STEM Datasets

Asymmetry and 4D-STEM: When the Phase Object Approximation Is Qualitatively Incorrect

Microscopy and Microanalysis

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Volume 26 - December 2020

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

Approaching Operando Imaging of Functional Materials

Call of the Wild: Advances in Microanalysis and Microscopy of Geological and Extraterrestrial Materials

Technologists' Forum Roundtable: Commercial Technical Careers in Microscopy - No PhD? No Worries

Biological Sciences Tutorial: CryoEM Sample Preparation: Problems and Potential Solutions

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures