Microscopy and Microanalysis: Volume 26 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - December 2020

Vendor Symposium - Imaging

An Optimized In-column Detection System for the Ultra-high Resolution BrightBeamTM SEM Column

High-resolution Multimodal Confocal Raman-imaging in SEM by Means of RISE Microscopy

NanoMi: An Open Source (Scanning) Transmission Electron Microscope.

Microbes in Focus

Cryo-EM of Helical Polymers at Near-atomic Resolution Yields Many Surprises

Structural Study of the Legionella pneumophila Dot/Icm T4SS Using Cryo-electron Microscopy

Imaging Fungal Contamination of Protective Organic Coatings

Image Processing Developments in Cryo-EM

Unsupervised Determination of the Number of Conformations in Single-particle Cryo-EM

Embedding Heterogeneous Cryo-EM Data with 3D Principal Component Analysis and Variational Autoencoders

CryoDRGN: Deep Generative Models for Reconstructing Heterogeneous 3D Structures from Cryo-electron Micrographs

Energy and Soft Materials and the Development of Cryogenic Techniques for Studying Them

Cryogenic-electron Microscopy for Battery Materials

Development of Cryogenic Techniques for Characterizing Energy Storage Materials in Electrochemical Process

Air-protective Cryo-FIB Tomography of Sensitive Materials for Energy Applications

Interphases of Magnesium Metal Anodes Enabled by Cryogenic Electron Microscopy

In Situ TEM at the Extremes - Mechanical

Investigating Alloying Effect on Dislocation Mechanisms with In Situ and Multi-dimensional Characterizations

Atomic-scale Analysis of Mechanical Response of SrTiO3 by MEMS-based in Situ STEM Mechanical Testing

In Situ TEM Investigation of the Electroplasticity Phenomenon in Ti-6Al

In Situ TEM at the Extremes - Mechanical Behaviors

In Situ Transmission Electron Microscopy Study on the Deformation Responses of Additively Manufactured Multiphase Ni-based Superalloy

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

Imaging Nucleation, Growth and Disorder at the Single-atom Level by Atomic Electron Tomography (AET)

Identifying Spatial Relationships in Metal-nanoparticle/Insulating-aerogel Catalytic Systems with Electron Tomography: Manual Segmentation vs. Machine-learning Classifiers

Extract High Resolution 3D Quantitative Elemental Map Using a Combined HAADF-STEM and EDS Tomography

Microscopy and Microanalysis

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Volume 26 - December 2020

Vendor Symposium - Imaging

Microbes in Focus

Image Processing Developments in Cryo-EM

Energy and Soft Materials and the Development of Cryogenic Techniques for Studying Them

In Situ TEM at the Extremes - Mechanical

In Situ TEM at the Extremes - Mechanical Behaviors

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering