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NanoMi: An Open Source (Scanning) Transmission Electron Microscope.

Published online by Cambridge University Press:  30 July 2020

Marek Malac ,
Martin Cloutier ,
Mark Salomons ,
Sean Chen ,
Suliat Yakubu ,
Marcus Leeson ,
Jason Pitters ,
Doug Vick ,
Drew Price  and
Darren Homeniuk
...Show all authors
Marek Malac
Affiliation:
NRC-NANO, Edmonton, Alberta, Canada Department of Physics, University of Alberta, Edmonton, Alberta, Canada
Martin Cloutier
Affiliation:
NRC-NANO, Edmonton, Alberta, Canada
Mark Salomons
Affiliation:
NRC-NANO, Edmonton, Alberta, Canada
Sean Chen
Affiliation:
University of British Columbia, Vancouver, British Columbia, Canada
Suliat Yakubu
Affiliation:
University of British Columbia, Vancouver, British Columbia, Canada
Marcus Leeson
Affiliation:
University of British Columbia, Vancouver, British Columbia, Canada
Jason Pitters
Affiliation:
NRC-NANO, Edmonton, Alberta, Canada
Doug Vick
Affiliation:
NRC-NANO, Edmonton, Alberta, Canada
Drew Price
Affiliation:
NRC-NANO, Edmonton, Alberta, Canada
Darren Homeniuk
Affiliation:
NRC-NANO, Edmonton, Alberta, Canada
Misa Hayashida
Affiliation:
National Research Council Canada, Edmonton, Alberta, Canada
Ray Egerton
Affiliation:
Department of Physics, University of Alberta, Edmonton, Alberta, Canada

Abstract

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Type
Vendor Symposium - Imaging
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1810 - 1811
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Copyright
Copyright © Microscopy Society of America 2020

References

https://www.gnu.org/licenses/old-licenses/gpl-2.0.en.htmlGoogle Scholar
https://nrc.canada.ca/en/, www.tem-eels.ca and www.msc-smc.orgGoogle Scholar
Rempfer, G., J. Appl. Phys. 57 (1985), p. 2385.10.1063/1.334347CrossRefGoogle Scholar
The support and encouragement of Brian Legge (JEOL Canada), Dr. Y. Taniguchi (Hitachi High Tech. Corp.), Dr. S. Motoki (JEOL Ltd), D. Hoyle (Hitachi High Tech.Canada) Dr. Y. Nagatani (JPARC, Japan), Dr. H. Okamoto (Akita Pref. U., Japan), Dr. M. Marko (Wadsworth Centre, New York, USA), Prof. M. Freeman (U of Alberta), Prof. M. Beleggia (Denmark, Tech. U) as well as many others made this project possible.Google Scholar