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Atomic-scale Analysis of Mechanical Response of SrTiO3 by MEMS-based in Situ STEM Mechanical Testing

Published online by Cambridge University Press:  30 July 2020

Eita Tochigi ,
Takaaki Sato ,
Naoya Shibata ,
Hiroyuki Fujita  and
Yuichi Ikuhara
Eita Tochigi
Affiliation:
University of Tokyo, , , Japan
Takaaki Sato
Affiliation:
University of Pennsylvania, , , United States
Naoya Shibata
Affiliation:
University of Tokyo, , , Japan
Hiroyuki Fujita
Affiliation:
Tokyo City University, , , Japan
Yuichi Ikuhara
Affiliation:
University of Tokyo, , , Japan

Abstract

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Type
In Situ TEM at the Extremes - Mechanical
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1838 - 1840
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Copyright
Copyright © Microscopy Society of America 2020

References

Yang, et al. , Ultramicroscopy 198, 43-48 (2019).10.1016/j.ultramic.2018.12.008CrossRefGoogle Scholar
Sato, T. et al. ., Microelectronic Engineering 164, 43-47 (2016).10.1016/j.mee.2016.06.018CrossRefGoogle Scholar
Hastings, W. K., Biometrika 57, 97–109 (1970).10.1093/biomet/57.1.97CrossRefGoogle Scholar