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Soft X-ray Scanning Transmission Microscopy Studies of Radiation Damage by Electron, Ion and X-ray Beams

Published online by Cambridge University Press:  30 July 2020

Adam Hitchcock ,
Hao Yuan ,
Lis Melo  and
Nabil Basim
Adam Hitchcock
Affiliation:
McMaster University, Hamilton, Ontario, Canada
Hao Yuan
Affiliation:
McMaster University, Hamilton, Ontario, Canada
Lis Melo
Affiliation:
McMaster University, Hamilton, Ontario, Canada
Nabil Basim
Affiliation:
McMaster University, Hamilton, Ontario, Canada

Abstract

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Type
Bridging the Fundamental Electron Dose Gap for Observing Atom Processes in Complex Materials in their Native Environments
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2072 - 2074
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Copyright
Copyright © Microscopy Society of America 2020

References

Jacobsen, C.J., X-ray Microscopy (Cambridge, 2019)10.1017/9781139924542CrossRefGoogle Scholar
Putz, A. et al. ECS Transactions 75 (2016) 3.10.1149/07514.0003ecstCrossRefGoogle Scholar
Melo, L.G.A., et al. , ECS Trans. 80 (2017) 275.10.1149/08008.0275ecstCrossRefGoogle Scholar
Leontowich, A.F.G., et al. , Rev. Sci. Inst. 89 (2018) 09374.10.1063/1.5041009CrossRefGoogle Scholar
Beetz, T. and Jacobsen, C., J. Syn. Rad 10 (2003) 280.10.1107/S0909049503003261CrossRefGoogle Scholar
Wu, J. et al. , J. Power Sources 381 (2018) 72.10.1016/j.jpowsour.2018.01.074CrossRefGoogle Scholar
Melo, L.G.A., et al. , J. Power Sources 312 (2016) 23.10.1016/j.jpowsour.2016.02.019CrossRefGoogle Scholar
Wu, J. et al. , J. Phys. Chem. C 122 (2018) 2537410.1021/acs.jpcc.8b07363CrossRefGoogle Scholar