Microscopy and Microanalysis: Volume 26 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - December 2020

Direct Phase Imaging with Coherent Electron Beam in TEM

Advancing the Hexapole Cs-Corrector for the Transmission Electron Microscope

Double-Slit Electron Interference Experiment with Phase Modulation

Characterization of Combustion Synthesis of Ferromagnetic FeAl2O4 spinel

On the Benefit of Aberration Correction in Cryo Electron Microscopy

Applications of Phase-Contrast STEM as Dose Efficient Method for High-resolution Imaging of Soft Materials

Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)

A New Kakanui Hornblende for Use by EPMA Labs

ColorSEM: Livetime Quantitative X-ray Mapping in an Integrated EDS Workflow

High Resolution Low kV SEM EDS – Breaking Convention with Low Working Distance EDS

Standard-less Quantification and Standard Customized Coefficients

Probelab ReImager: Open Source Software for Streamlining Image Processing

Bremsstrahlung Background Modeling Without Fit Regions

EPMA Characterization of Gold Associated with Different Sulfide Textures at the Monument Bay Deposit, Manitoba, Canada

EDS Analysis of Icosahedral Quasicrystalline Thin Film in Al65Cu25Fe15 Alloy Prepared by Arc-melting

Definition of the Detection Limit in Energy-dispersive Spectrometry

Characterization of KNb3O8 Powders by Raman Spectroscopy and Scanning Electron Microscopy

The Effect of Deadtime and Pulse Processing Time Constant on Standards-based Quantitative EDS Microanalysis

SrTiO3 Surface Post Photocatalytic Water Oxidation: TEM Chemical and Structural Analyses

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens

Electrochemical Study of Metallic Foams Ti-Ta-Sn Through SEM

Elemental Morphological and Chemical Characterization of Individual TSP Particles by SEM-EDS

Mill Processing in Three Different Devices; The Effect of Intrinsic Intensity on the Material

Microscopy and Microanalysis

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Volume 26 - December 2020

Direct Phase Imaging with Coherent Electron Beam in TEM

Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens