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On the Benefit of Aberration Correction in Cryo Electron Microscopy

Published online by Cambridge University Press:  30 July 2020

Martin Linck ,
Heiko Müller ,
Peter Hartel ,
Svenja Perl ,
Stephan Uhlemann  and
Max Haider
Martin Linck
Affiliation:
CEOS GmbH, Heidelberg, Baden-Wurttemberg, Germany
Heiko Müller
Affiliation:
CEOS GmbH, Heidelberg, Baden-Wurttemberg, Germany
Peter Hartel
Affiliation:
CEOS GmbH, Heidelberg, Baden-Wurttemberg, Germany
Svenja Perl
Affiliation:
CEOS GmbH, Heidelberg, Baden-Wurttemberg, Germany
Stephan Uhlemann
Affiliation:
CEOS GmbH, Heidelberg, Baden-Wurttemberg, Germany
Max Haider
Affiliation:
CEOS GmbH, Heidelberg, Baden-Wurttemberg, Germany

Abstract

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Type
Direct Phase Imaging with Coherent Electron Beam in TEM
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2156 - 2157
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Copyright
Copyright © Microscopy Society of America 2020

References

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[$] CEOS GmbH has received funding from the European Union's Horizon 2020 research and innovation program under grant agreement No. 823717 – ESTEEM3.Google Scholar