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EDS Analysis of Icosahedral Quasicrystalline Thin Film in Al65Cu25Fe15 Alloy Prepared by Arc-melting

Published online by Cambridge University Press:  30 July 2020

Heavenly Duley ,
Nicholas Niespodzianski ,
Yaminah Merando ,
Jeremy Marshall  and
Chunfei Li
Heavenly Duley
Affiliation:
Clarion University of Pennsylvania, Clarion, Pennsylvania, United States
Nicholas Niespodzianski
Affiliation:
Clarion University of Pennsylvania, Clarion, Pennsylvania, United States
Yaminah Merando
Affiliation:
Clarion University of Pennsylvania, Clarion, Pennsylvania, United States
Jeremy Marshall
Affiliation:
Clarion University of Pennsylvania, Clarion, Pennsylvania, United States
Chunfei Li
Affiliation:
Clarion University of Pennsylvania, Clarion, Pennsylvania, United States

Abstract

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Type
Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2186 - 2187
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Copyright
Copyright © Microscopy Society of America 2020

References

• Goldstein, J. I., Newbury, D. E., Michael, J. R., Ritchie, N. W., Scott, J. H. J., & Joy, D. C. (2017). Scanning electron microscopy and X-ray microanalysis. Springer.Google Scholar
• Smith, K., Baker, A., Beckey, J., Mankos, C., & Li, C. (2018). Energy Dispersive X-ray Spectroscopic Analysis of Al-Cu-Fe Quasicrystalline Thin Film Layer. Microscopy and Microanalysis, 24(S1), 766–767.10.1017/S1431927618004324CrossRefGoogle Scholar