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Scanning Ion Conductance Microscopy (SICM) for Low-stress Directly Examining of Cellular Mechanics

Published online by Cambridge University Press:  30 July 2020

Petr Gorelkin ,
Alexander Erofeev ,
Vasilii Kolmogorov ,
Yuri Efremov ,
Pavel Novak ,
Andrew Shevchuk ,
Alexander Majouga  and
Yuri Korchev
Petr Gorelkin
Affiliation:
Medical Nanotechnologyn; National University of Science and Technology MISiS, Moscow, Moskva, Russia
Alexander Erofeev
Affiliation:
National University of Science and Technology “MISIS”; Lomonosov Moscow State University, Moscow, Moskva, Russia
Vasilii Kolmogorov
Affiliation:
National University of Science and Technology “MISIS”; Lomonosov Moscow State University, Moscow, Moskva, Russia
Yuri Efremov
Affiliation:
I.M. Sechenov First Moscow State Medical University (Sechenov University), Moscow, Moskva, Russia
Pavel Novak
Affiliation:
National University of Science and Technology “MISIS”; Lomonosov Moscow State University, Moscow, Moskva, Russia
Andrew Shevchuk
Affiliation:
Imperial College London, London, England, United Kingdom
Alexander Majouga
Affiliation:
National University of Science and Technology “MISIS”; Lomonosov Moscow State University, Moscow, Moskva, Russia
Yuri Korchev
Affiliation:
Imperial College London, London, England, United Kingdom

Abstract

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Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Surface Analysis and Spectroscopy III - Applications to Interface Chemistry
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1968 - 1970
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Copyright
Copyright © Microscopy Society of America 2020

References

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