Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Advances in Scanning Electron/Ion Instrumentation and Detectors

Abstract

Nanoscale Cathodoluminescence of an InGaN Single Quantum Well Intersected by Individual Dislocations

STEM/SEM, Chemical Analysis, Atomic Resolution and Surface Imaging At ≤ 30 kV with No Aberration Correction for Nanomaterials on Graphene Support

Is It Possible to Image the Auger Electron Signal in a Conventional SEM Using a Segmented Annular BSED and Stage Bias?

Comparison of Secondary, Backscattered and Low Loss Electron Imaging for Dimensional Measurements in the Scanning Electron Microscope - Part 2

New Methods for Measuring Chemistry and Temperature Using Scanning Ion and Electron Beams

Hydrogen Ion Beams from Nanostructured Gas Field Ion Sources

Novel Scanning Ion Microscope with H3+ Gas Field Ionization Source

Reactive Gas Ion Beam Generation Using Single Atom W(111) Gas Field Ion Sources

Nanometer Scale Time of Flight Back Scattering Spectrometry in the Helium Ion Microscope

Image Simulation and Analysis to Predict the Sensitivity Performance of a Multi-Electron Beam Wafer Defect Inspection Tool

Design of a HAADF Detector for Z Contrast in SEM

A Combination BSE and CL Detector using Silicon Photomultipliers

In-Depth Sample Analysis with a Signal-Selective SEM Detection System

Image Sharpness Measurement in Scanning Electron Microscopy Based On Derivative Method In ISO/TS 24597 document

A Static Low Energy Ion Source for Local Surface Modification

“Smart Microscopy”: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy

The Determination of Lattice Parameters Using Single EBSD Patterns

Practical Considerations for High-Resolution Transmission Kikuchi Diffraction Mapping and Analysis in Titanium Alloys

EDS Windows and Plasma Cleaning: Characterization and Damage Mechanisms

The Study of “Window-less” EDS Detector With Low Voltage FE-SEM

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Advances in Scanning Electron/Ion Instrumentation and Detectors

Abstract