STEM/SEM, Chemical Analysis, Atomic Resolution and Surface Imaging At ≤ 30 kV with No Aberration Correction for Nanomaterials on Graphene Support

Takeshi Sunaoshi; Kazutoshi Kaji; Yoshihisa Orai; C.T. Schamp; Edgar Voelkl

doi:10.1017/S1431927616003871

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References

[1] Egerton, R.F. Electron Energy-Loss Spectroscopy in Electron Microscope. Springer, New York.Google Scholar

[2] Suenaga, K., et al., Nature Vol. 468 (2010) 1088–1090.Google Scholar

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[4] (The authors wish to thank Dr. Tsuyohiko Fujigaya, Kyushu University for providing the samples.Google Scholar

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STEM/SEM, Chemical Analysis, Atomic Resolution and Surface Imaging At ≤ 30 kV with No Aberration Correction for Nanomaterials on Graphene Support

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