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Design of a HAADF Detector for Z Contrast in SEM

Published online by Cambridge University Press:  25 July 2016

Gilles L’Espérance ,
Jean-Paul Baïlon ,
Olivier Sioui-Latulipe ,
John Hunt  and
Sander Gubbens
Gilles L’Espérance
Affiliation:
Ecole Polytechnique, (CM)2, Montréal (QC) H3C 3A7Canada
Jean-Paul Baïlon
Affiliation:
Ecole Polytechnique, (CM)2, Montréal (QC) H3C 3A7Canada
Olivier Sioui-Latulipe
Affiliation:
Ecole Polytechnique, (CM)2, Montréal (QC) H3C 3A7Canada
John Hunt
Affiliation:
Gatan Inc., 5794 W Las Positas Blvd, Pleasanton, CAUSA
Sander Gubbens
Affiliation:
Gatan Inc., 5794 W Las Positas Blvd, Pleasanton, CAUSA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 622 - 623
Copyright
© Microscopy Society of America 2016 

References

[1] Williams, D.B. & Carter, C.B. in Transmission Electron Microscopy. ed., (Plenum Press (1996) vol ume III Imaging (p. 358–361.Google Scholar
[2] CASINO, V 2.4.8. http://www.gel.usherbrooke.ca/casino/what.html.Google Scholar