Microscopy and Microanalysis: Volume 25 - Issue S2

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 25 - Supplement S2 - August 2019

Analytical and Instrumentation Science Symposia

Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy

Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis

A Combination of Un-supervised and Supervised Machine Learning Method for Auto-thresholding Scanning Electron Microscopy Images

Optimizing Reflector Selection for Indexing of EBSD Patterns via Dynamic Pattern Simulation

Application of Forward Modelling and Dictionary Indexing to EBSD Orientation Data as a Means of Quantifying Dislocation Substructure Formation in FCC Metals

Simulating Thermal Noise for S/TEM Images from Atom Coordinate Data

Expanding the Dimensions of a High Dynamic Range Detector with a Limited Number of Pixels via Scripting

3D Platform for Machine Learning Based Segmentation and Visualization Using FIB-SEM Imagery

Using Neural Networks to Identify Atoms in HRTEM Images

A Workflow for Imaging 2D Materials using 4D STEM-in-SEM

USID and Pycroscopy – Open Source Frameworks for Storing and Analyzing Imaging and Spectroscopy Data

Extending Monte Carlo Simulations of Electron Microscopy Images and Hyperspectral Images in a User-Friendly Framework

Scanning Electron Microscope 3D Surface Reconstruction via Optimization

First Auto-Magnifier Platform for Hardware Assurance and Reverse Engineering Integrated Circuits

Processing Structurally Heterogeneous Cryo-EM Data Using Atomic Models

The Effect of Nonuniform Pixel Responses in CCD on Quantitative Analysis

Towards Reproducible and Transparent Science of (Big) Electron Microscopy Data Using Version Control

Real-Time Data Processing using Python in DigitalMicrograph

Novel SEM and DualBeam experiments with Python

Workshop App: the Data Analysis Design Pattern of the Enabler Framework

How Does the Internal Structure of Cardiac Muscle Cells Regulate Cellular Metabolism?

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 25 - Supplement S2 - August 2019

Analytical and Instrumentation Science Symposia

Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy