Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-24T20:43:40.452Z Has data issue: false hasContentIssue false
  • English
  • Français

A Workflow for Imaging 2D Materials using 4D STEM-in-SEM

Published online by Cambridge University Press:  05 August 2019

Benjamin W. Caplins ,
Ryan M. White ,
Jason D. Holm  and
Robert R. Keller
Benjamin W. Caplins*
Affiliation:
Material Measurement Lab, National Institute of Standards and Technology, Boulder, CO, USA
Ryan M. White
Affiliation:
Material Measurement Lab, National Institute of Standards and Technology, Boulder, CO, USA
Jason D. Holm
Affiliation:
Material Measurement Lab, National Institute of Standards and Technology, Boulder, CO, USA
Robert R. Keller
Affiliation:
Material Measurement Lab, National Institute of Standards and Technology, Boulder, CO, USA
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 218 - 219
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Lenthe, W.C. et al. , Ultramicroscopy 195 (2018), p. 93.Google Scholar
[2]Egerton, R.F., Micron 119 (2019), p. 72.Google Scholar
[3]Gulde, M. et al. , Science 345 (2014), p. 200.Google Scholar
[4]Han, Y. et al. , Nano Letters 18 (2018), p. 3746.Google Scholar
[5]This work is a contribution of the US Government and is not subject to United States copyright.Google Scholar