Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Analytical and Instrumentation Science Symposia

Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy

Nion Swift: Open Source Image Processing Software for Instrument Control, Data Acquisition, Organization, Visualization, and Analysis Using Python.

py4DSTEM: Open Source Software for 4D-STEM Data Analysis

Distinguishability of Structures via Principal Component Analysis: Application to 4D STEM

Atomic Resolution Convergent Beam Electron Diffraction Analysis Using Convolutional Neural Networks

Statistical Physics-based Framework and Bayesian Inference for Model Selection and Uncertainty Quantification

Scientific Python: A Mature Computational Ecosystem for Microscopy

Fuzzy Clustering to Merge EDS and EBSD Datasets with Crystallographic Ambiguity

Utilizing an Open-Source Workflow for the Analysis of Atom Dynamics in Two-Dimensional Materials

Open Source Development Tools for Robust and Reproducible Electron Microscopy Data Analysis

Harvesting Microscopy Experimental Context with a Configurable Laboratory Information Management System

ImageJ for the Next Generation of Scientific Image Data

Semantic SEM Image Segmentation of Concrete with Contextual Labels

Enhancement for MAINMAST, De Novo Main-Chain Tracing Method: Symmetric Multi-Chain Modeling, Local Refinement, and Graphical User Interface

Comparison of Techniques for Fine Alignment of Image Stacks in Serial Block-Face Electron Microscopy

Machine Learning for High Throughput HRTEM Analysis

Performance Analysis of Interaction-Free-Measurement-based Electron Microscopy

An Adaptive Sparse Sampling Scheme for Scanning Electron Microscopy using Delauney Triangulation

Statistical Machine Learning and Compressed Sensing Approaches for Analytical Electron Tomography - Application to Phase Change Materials

Deep Learning for Sparse Scanning Electron Microscopy

Maximal Resolution from the Ronchigram: Human vs. Deep Learning

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Analytical and Instrumentation Science Symposia

Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy