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An Adaptive Sparse Sampling Scheme for Scanning Electron Microscopy using Delauney Triangulation

Published online by Cambridge University Press:  05 August 2019

Tim Dahmen  and
Patrick Trampert
Tim Dahmen*
Affiliation:
German Research Center for Artificial Intelligence (DFKI), Saarbrücken, Germany.
Patrick Trampert
Affiliation:
German Research Center for Artificial Intelligence (DFKI), Saarbrücken, Germany. Saarland University, Saarbrücken, Germany
*
*Corresponding author: [email protected]

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 154 - 155
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Grosche, S et al. IEEE International Conference on Imaging Systems and Techniques (2018) p. 1-6.Google Scholar
[2]Dahmen, T et al. Scientific Reports 6 (2016) 25350.Google Scholar
[3]Boughorbel, F et al. Microsc. & Microanal. 23 S1 (2017) p. 150-151.Google Scholar