Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Analytical and Instrumentation Science Symposia

Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy

Dynamic Random Scan Approach of Spectrum Imaging for Temporal Evolution of Spectroscopic Signals

DefectNet – A Deep Convolutional Neural Network for Semantic Segmentation of Crystallographic Defects in Advanced Microscopy Images

Automated Real-time Analysis of Atomic-resolution STEM Images

Merging Deep Learning, Chemistry, and Diffraction for High-Throughput Material Structure Prediction

FerroNet: Machine Learning Flow for Analysis of Ferroelectric and Ferroelastic Materials

Deep Learning Enabled Measurements of Single-Atom Defects in 2D Transition Metal Dichalcogenides with Sub-Picometer Precision

Removing Stripes, Scratches, and Curtaining with Non-Recoverable Compressed Sensing

Advancements to the Digital Representation Environment for Analysis of Materials in 3-Dimensions—DREAM.3D

Using Deep Learning to Deconvolute Complex Spectra for Hyperspectral Imaging Applications

Machine Learning for Challenging EELS and EDS Spectral Decomposition

Deep-Learning Based Autofocus Score Prediction of Scanning Electron Microscope

Information theory based crystallographic symmetry classifications of a noisy 2D periodic scanning tunneling microscope image

Iterative Machine Learning Method for Pore-Back Artifact Mitigation in High Porosity Membrane FIB-SEM Image Segmentation

Two-stage Neural Architecture Search for Microscopy Image Segmentation

Deep Learning as a Tool for Image Denoising and Drift Correction

Towards Fast and Direct Memory Read-out by Multi-beam Scanning Electron Microscopy and Deep Learning Image Classification

Machine Learning Approaches for Analysis of Multiscale Imaging Data for Atmospheric and Soil Particles

Sparse Scanning Electron Microscopy and Deep Learning for Imaging and Segmentation of Neuron Structures

Machine Learning and Computer Vision for the Classification of Carbon Nanotube and Nanofiber Structures from Transmission Electron Microscopy Data

Image Registration of Low-Signal-to-Noise STEM Data with Open Source Software

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Analytical and Instrumentation Science Symposia

Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy