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Removing Stripes, Scratches, and Curtaining with Non-Recoverable Compressed Sensing

Published online by Cambridge University Press:  05 August 2019

Jonathan Schwartz ,
Yi Jiang ,
Yongjie Wang ,
Anthony Aiello ,
Pallab Bhattacharya ,
Hui Yuan ,
Zetian Mi ,
Nabil Bassim  and
Robert Hovden
Jonathan Schwartz
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA.
Yi Jiang
Affiliation:
X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA.
Yongjie Wang
Affiliation:
Department of Electrical Engineering and Computer Science, University of Michigan, MI, USA.
Anthony Aiello
Affiliation:
Department of Electrical Engineering and Computer Science, University of Michigan, MI, USA.
Pallab Bhattacharya
Affiliation:
Department of Electrical Engineering and Computer Science, University of Michigan, MI, USA.
Hui Yuan
Affiliation:
Canadian Centre for Electron Microscopy, McMaster University, Hamilton, ON, Canada.
Zetian Mi
Affiliation:
Department of Electrical Engineering and Computer Science, University of Michigan, MI, USA.
Nabil Bassim
Affiliation:
Department of Material Science and Engineering, McMaster University, Hamilton, ON, Canada.
Robert Hovden
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA.

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 174 - 175
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Zaefferer, S, Wright, S and Raabe, D, Metallurgical and Materials Transactions A 39 (2008), p. 374.Google Scholar
[2]Leary, R, Saghi, Z and Midgley, P, Holland, D. Ultramicroscopy 131 (2013), p. 70.Google Scholar
[3]Schwartz, J et al. , arXiv:1901.08001 [cs.CV].Google Scholar