Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Analytical and Instrumentation Science Symposia

Advances in Phase Retrieval Microscopy

Local Phase Curvature Measurement in STEM With a Pixelated Detector

Phase Plate STEM Imaging Using Two Dimensional Electron Detector

Large Field of View Strain Characterization in a Scanning Transmission Electron Microscope Using a Designed Coherent Sampler

High-Angular Splitting Electron Vortex Beams Generated by Topological Defects

Feasibility of an Electron Orbital Angular Momentum Sorter

Potentially Programmable Virtual Phase Plate for Electron Beams

Transforming a Thermionic Transmission Electron Microscope into an Electron Interferometer

Lorentz Implementation of STEM Holography

Direct Correction of Residual Symmetric Aberrations in Electron Holograms of Weak Phase Objects

Improvement of Accuracy in Particle Extraction from Reconstructed Phase Image of Electron Holograms

Electron Holography on Fraunhofer Diffraction Using Double Slit

Dislocation Core Phase Imaging by DBI

Quick Evaluation of Potential Difference on Al/Al3Fe Interface in a Conventional Transmission Electron Microscope

A Semi-quantitative Predictive Model for SnO2 Adatom Diffusion & Its Application to Exit Wave Reconstruction

Measurements of Amorphous (a)-C, Au + a-C and a-Metal TEM Specimen Stabilities for HRTEM Studies

SQUARREL: Scattering Quotient Analysis to Retrieve the Ratio of Elements in X-ray Ptychography

Correlative 3D X-ray Fluorescence and Ptychographic Tomography of Frozen-Hydrated Green Algae

Ptychographic Complex Imaging Reflectometry for Spatially-Resolved Dopant Profiling Using a Tabletop EUV Source

Generalized Proximal Smoothing for Phase Retrieval

Hollow-Cone Foucault Imaging Method for Magnetic Structure Observations

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Analytical and Instrumentation Science Symposia

Advances in Phase Retrieval Microscopy