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Electron Holography on Fraunhofer Diffraction Using Double Slit

Published online by Cambridge University Press:  05 August 2019

Ken Harada ,
Kodai Niitsu ,
Keiko Shimada ,
Tetsuji Kodama ,
Tetsuya Akashi ,
Yoshimasa A. Ono ,
Daisuke Shindo ,
Hiroyuki Shinada  and
Shigeo Mori
Ken Harada
Affiliation:
CEMS, RIKEN (The Institute of Physical and Chemical Research), Hatoyama, Saitama 350-0395, Japan Department of Materials Science, Osaka Prefecture University, Sakai, Osaka 599-8531, Japan
Kodai Niitsu
Affiliation:
Department of Materials Science & Engineering, Kyoto University, Kyoto, Kyoto 606-8501, Japan
Keiko Shimada
Affiliation:
CEMS, RIKEN (The Institute of Physical and Chemical Research), Hatoyama, Saitama 350-0395, Japan
Tetsuji Kodama
Affiliation:
Graduate School of Science & Technology, Meijo University, Nagoya, Aichi 468-8502, Japan
Tetsuya Akashi
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Saitama 350-0395, Japan Department of Applied Quantum Physics, Kyushu University, Fukuoka, Fukuoka 810-0395, Japan
Yoshimasa A. Ono
Affiliation:
CEMS, RIKEN (The Institute of Physical and Chemical Research), Hatoyama, Saitama 350-0395, Japan
Daisuke Shindo
Affiliation:
CEMS, RIKEN (The Institute of Physical and Chemical Research), Hatoyama, Saitama 350-0395, Japan IMRAM, Tohoku University, Sendai, Miyagi 980-8577, Japan
Hiroyuki Shinada
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Saitama 350-0395, Japan
Shigeo Mori
Affiliation:
Department of Materials Science, Osaka Prefecture University, Sakai, Osaka 599-8531, Japan

Abstract

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Type
Advances in Phase Retrieval Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 102 - 103
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Harada, K. et al. , Microscopy, 68 (2019), doi: 10.1093/jmicro/dfz007.Google Scholar
[2]Harada, K. et al. , Scientific Reports, 8 (2018) 1008.Google Scholar
[3]Linfoot, E. H. and Wolf, E., Proc. Phys. Soc., B 69 (1956) 823.Google Scholar
[4]Farnell, G. W., Can. J. Phys., 35 (1957) 777; ibid 36 (1958) 935.Google Scholar
[5]The authors would like to thank Dr. Y. Takahashi of Hitachi, Ltd., and Dr. H. Yoshikawa of NIMS for their valuable discussion.Google Scholar
[6]This work was supported by KAKENHI, Grant-in-Aid for Scientific Research ((B) 18H03475).Google Scholar