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Large Field of View Strain Characterization in a Scanning Transmission Electron Microscope Using a Designed Coherent Sampler

Published online by Cambridge University Press:  05 August 2019

A. Pofelski ,
S. Ghanad-Tavakoli ,
D. A. Thompson  and
G. A. Botton
A. Pofelski*
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, Canada
S. Ghanad-Tavakoli
Affiliation:
Department of Engineering Physics and Centre for Emerging Devices Technology, McMaster University, Hamilton, Canada
D. A. Thompson
Affiliation:
Department of Engineering Physics and Centre for Emerging Devices Technology, McMaster University, Hamilton, Canada
G. A. Botton*
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, Canada
*
*Corresponding authors: [email protected], [email protected]
*Corresponding authors: [email protected], [email protected]

Abstract

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Type
Advances in Phase Retrieval Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 86 - 87
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Su, D., Zhu, Y., Ultramicroscopy, 110 (2010), p. 229-233Google Scholar
[2]Ishizuka, A., Hytch, M., Ishizuka, K., Microscopy, 66 (2017), p. 217–221Google Scholar
[3]Hÿtch, M.J., Snoeck, E., Kilaas, R., Ultramicroscopy, 74, (1998), p. 131-146Google Scholar
[4]Pofelski, A. et al. , Ultramicroscopy, 187 (2018), p. 1-12Google Scholar
[5]STEM_Moire_GPA software, https://github.com/slimpotatoes/STEM_Moire_GPA (accessed February 19, 2019)Google Scholar
[6]This work is supported by NSERC under a Discovery Grant program. The experimental work was carried out at the Canadian Centre for Electron Microscopy, a facility supported by the Canada Foundation for Innovation under the MSI program, NSERC and McMaster University.Google Scholar