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A Combination of Un-supervised and Supervised Machine Learning Method for Auto-thresholding Scanning Electron Microscopy Images

Published online by Cambridge University Press:  05 August 2019

Bianzhu Fu ,
Thomas Parson ,
Atanu Das ,
Michael Deangelo  and
Emmanuel Appiah-Amponsah
Bianzhu Fu
Affiliation:
Entegris, Inc., 7 Commerce Dr, Danbury, CT 06810
Thomas Parson
Affiliation:
Entegris, Inc., 7 Commerce Dr, Danbury, CT 06810
Atanu Das
Affiliation:
Entegris, Inc., 7 Commerce Dr, Danbury, CT 06810
Michael Deangelo
Affiliation:
Entegris, Inc., 7 Commerce Dr, Danbury, CT 06810
Emmanuel Appiah-Amponsah
Affiliation:
Entegris, Inc., 7 Commerce Dr, Danbury, CT 06810

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 204 - 205
Copyright
Copyright © Microscopy Society of America 2019 

References

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[7]S. Walt et al and the scikit-image contributors. scikit-image: Image processing in Python. PeerJ 2:e453 (2014) http://dx.doi.org/10.7717/peerj.453Google Scholar