Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Analytical and Instrumentation Science Symposia

Low Voltage, Low Energy Electron Microscopy Imaging and Analysis

Studying 2D Materials by Means of Microscopy and Spectroscopy with Low Energy Electrons

Light Element Imaging Technique at Low Dose Condition by Processing Simultaneously Obtained STEM Images Using a Segmented Detector

Ion-Irradiated Damage in Semiconductors Visualized by Means of Low-kV Scanning Electron Microscopy

Characterization of Nopal Nanoparticles by Electron Microscopy Techniques

Microstructural Characterization of Casein by Microscopy and Spectroscopy Techniques

Electron Microscopy of Sulfur Selenium Alloy with High –K Dielectric Properties.

Visualizing Electron-Molecule Dynamics with In-situ Fluorescence in a Few eV-SEM

Soft Microscopy Of Macromolecules: Correlative Imaging and Enhancing Contrast

Graded Microstructure of Additive Manufactured Ti-6Al-4V via Electron Beam Melting

Contamination Mitigation Strategy for Ultra-Low Energy Electron Microscopy and Spectroscopy

A Compact Aberration Corrector for SEMs with Electrostatic-field formed by Annular and Circular Electrodes

Electron Channelling Contrast Imaging in a Low Voltage Scanning Electron Microscope

Electronic Structure and Coupling of Re Clusters In Monolayer MoS2

Sample Orientation for Electron Channeling Contrast Imaging

Imaging Reaction Dynamics on Inverse Model Catalyst Surfaces by In Situ Environmental SEM

Vendor Symposium

Advances in STEM and EELS: New Operation Modes, Detectors and Software

Improvement of Spatial Resolution in Z Direction with Improved Energy Spread Measured using Aberration Corrected STEM with Cold Field Emission Gun

News on Silicon Drift Detectors for High Resolution EDX Imaging and Spectroscopy

BX-1: A New Detector Window for Microanalysis Applications

Use of Wavelength- and Angle-Resolved Cathodoluminescence for Spectroscopic Analysis of the Emission Pattern of a Nitride Semiconductor Micro Pillar Array

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Analytical and Instrumentation Science Symposia

Low Voltage, Low Energy Electron Microscopy Imaging and Analysis

Vendor Symposium