Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-25T04:48:04.905Z Has data issue: false hasContentIssue false
  • English
  • Français

News on Silicon Drift Detectors for High Resolution EDX Imaging and Spectroscopy

Published online by Cambridge University Press:  05 August 2019

Adrian Niculae ,
Thiago Barros ,
Alois Bechteler ,
Robert Lackner ,
Kathrin Hermenau ,
Klaus Heizinger ,
Tristan Mönninghoff ,
Heike Soltau  and
Lothar Strüder
Adrian Niculae*
Affiliation:
PNDetector GmbH, München, Germany.
Thiago Barros
Affiliation:
PNDetector GmbH, München, Germany.
Alois Bechteler
Affiliation:
PNDetector GmbH, München, Germany.
Robert Lackner
Affiliation:
PNDetector GmbH, München, Germany.
Kathrin Hermenau
Affiliation:
PNDetector GmbH, München, Germany.
Klaus Heizinger
Affiliation:
PNSensor GmbH, München, Germany.
Tristan Mönninghoff
Affiliation:
PNDetector GmbH, München, Germany.
Heike Soltau
Affiliation:
PNDetector GmbH, München, Germany.
Lothar Strüder
Affiliation:
PNSensor GmbH, München, Germany.
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 516 - 517
Copyright
Copyright © Microscopy Society of America 2019