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Studying 2D Materials by Means of Microscopy and Spectroscopy with Low Energy Electrons

Published online by Cambridge University Press:  05 August 2019

Ivo Konvalina ,
Benjamin Daniel ,
Martin Zouhar ,
Jakub Piňos ,
Tomáš Radlička ,
Luděk Frank ,
Ilona Müllerová  and
Eliška Materna Mikmeková
Ivo Konvalina*
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments of the CAS, v. v. i., Brno, Czech Republic.
Benjamin Daniel
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments of the CAS, v. v. i., Brno, Czech Republic.
Martin Zouhar
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments of the CAS, v. v. i., Brno, Czech Republic.
Jakub Piňos
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments of the CAS, v. v. i., Brno, Czech Republic.
Tomáš Radlička
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments of the CAS, v. v. i., Brno, Czech Republic.
Luděk Frank
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments of the CAS, v. v. i., Brno, Czech Republic.
Ilona Müllerová
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments of the CAS, v. v. i., Brno, Czech Republic.
Eliška Materna Mikmeková
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments of the CAS, v. v. i., Brno, Czech Republic.
*
*Corresponding author: [email protected]

Abstract

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Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 482 - 483
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Bhimanapati, GR et al. , ACS Nano 9 (2015), p. 11509-11539.Google Scholar
[2]DIGUN, https://www.delong.cz/products/electron-guns/ (accessed February 18, 2019).Google Scholar
[3]Müllerová, I and Frank, L, Adv. Imag. Elect. Phys. 128 (2003), p. 309-443.Google Scholar
[4]Stephens, WE, Phys. Rev. 69 (1946), p. 691.Google Scholar
[5]RoentDek Delayline Detectors, www.roentdek.com/detectors/ (accessed February 18, 2019).Google Scholar
[6]Seah, MP and Dench, WA, Surf. Interface Anal. 1 (1979) p. 2-11.Google Scholar
[7]The authors acknowledge funding from the Technology Agency of the Czech Republic (Centre of Electron and Photonic Optics, no: TN01000008).Google Scholar