Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Analytical and Instrumentation Science Symposia

Vendor Symposium

Live Color SEM Imaging

Development of in situ Imaging Capabilities in SEM and Their Applications

TESCAN Cryo FIB-SEM as a Flexible Tool for Advanced Sample Analysis

A 331-Beam Scanning Electron Microscope

Latest Developments in Multiple Ion Species Plasma FIB Technology

Current Trends and Challenges in Electron Energy-Loss Spectroscopy

Atomic-Plane Resolved Electron Magnetic Circular Dichroism by Achromatic Spatially-Resolved Electron Energy Loss Spectroscopy

Rapid Simulation of Elemental Maps in Core-Loss Electron Energy Loss Spectroscopy

Atomic-Scale Characterization of Ferro-Electric Domains in Lithium Niobate-revealing the Electronic Properties of Domain Walls

Understanding the Complex Structure of CeO2/TiO2 Nanocatalyst. Key Contributions of the Combined Use of HAADF, X-EDS and EELS Spectroscopies

Harnessing Local Sample Variations to Generate Self-Consistent EELS References for Stoichiometry Quantification

Atomic-resolution spectroscopy of quantum materials at cryogenic temperatures

Direct Detection EELS at High Energy: Elemental Mapping and EXELFS

The Performance of Electron Counting Direct Detection in Electron Energy Loss Spectroscopy

Unveiling the Ferroelectric Behavior of HfO2 Thin Films Using Fast DualEELS Analysis

Development of Monochromatic Analytical Electron Microscope Equipped with Higher-Order Aberration Corrector

Atomically Resolved Vibrational Spectroscopy in the Electron Microscope

Prospects for Spatially-Resolved EELS of Atomic Point Defects

Atomic Resolution Vibrational Spectroscopy with On-Axis Detector Geometry

Probing Phonon and Infrared-Plasmons in Nanoscale Interfaces

Characterization of Sub-Bandgap Plasmon Excitations in Transparent Conducting Oxides with Electron Energy-Loss Spectroscopy

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Analytical and Instrumentation Science Symposia

Vendor Symposium

Current Trends and Challenges in Electron Energy-Loss Spectroscopy