Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-25T03:50:11.700Z Has data issue: false hasContentIssue false
  • English
  • Français

Harnessing Local Sample Variations to Generate Self-Consistent EELS References for Stoichiometry Quantification

Published online by Cambridge University Press:  05 August 2019

Berit H. Goodge ,
Hari P. Nair ,
Jacob P. Ruf ,
Nathaniel J. Schreiber ,
Kyle M. Shen ,
Darrell G. Schlom  and
Lena F. Kourkoutis
Berit H. Goodge
Affiliation:
1School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, USA
Hari P. Nair
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA
Jacob P. Ruf
Affiliation:
Department of Physics, Cornell University, Ithaca, NY, USA
Nathaniel J. Schreiber
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA
Kyle M. Shen
Affiliation:
Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, USA Department of Physics, Cornell University, Ithaca, NY, USA
Darrell G. Schlom
Affiliation:
Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, USA Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA
Lena F. Kourkoutis*
Affiliation:
1School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, USA
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Current Trends and Challenges in Electron Energy-Loss Spectroscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 580 - 581
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Gloter, , et al. Mater. Sci. in Semicond. Process. 65:101016 (2017).Google Scholar
[2]Hart, , et al. Sci. Rep. 7 (2017), p. 8243.Google Scholar
[3]Goodge, Baek, Kourkoutis., Microscopy & Microanalysis 24 S1 (2018), p. 1844.Google Scholar
[4]Nair, , et al. APL Materials 6:101108 (2018).Google Scholar
[5]Support: NSF (DMR-1539918, DMR-1429155, DMR-1719875) and AFOSR (FA 9550-16-1-0305).Google Scholar