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Use of Wavelength- and Angle-Resolved Cathodoluminescence for Spectroscopic Analysis of the Emission Pattern of a Nitride Semiconductor Micro Pillar Array

Published online by Cambridge University Press:  05 August 2019

J. Lee ,
M. Bertilson ,
D.J Stowe ,
T Worsley  and
J.A Hunt
J. Lee
Affiliation:
Gatan Inc, Pleasanton, California, United States of America
M. Bertilson
Affiliation:
Gatan Inc, Pleasanton, California, United States of America
D.J Stowe*
Affiliation:
Gatan Inc, Pleasanton, California, United States of America
T Worsley
Affiliation:
Gatan Inc, Pleasanton, California, United States of America
J.A Hunt
Affiliation:
Gatan Inc, Pleasanton, California, United States of America
*
*Corresponding author: [email protected]

Abstract

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Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 520 - 521
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Yamamoto, N, The Transmission Electron Microscope, Ed. Maaz, K, (In Tech, 2012).Google Scholar
[2]Bertilson, M et al. , Microscopy and Microanalysis Conference Proceedings (2018).Google Scholar
[3]Ma, M et al. , Apply. Phys. Letts 101, 141105 (2012).Google Scholar