Microscopy and Microanalysis: Volume 20 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Advances in Imaging and Spectroscopy in STEM

Abstract

Inelastic STEM Imaging Based on Low-Loss Spectroscopy

Atomic Imaging and Spectroscopy of Two-Dimensional Materials

Imaging and Spectroscopy of Graphene/Hexagonal Boron Nitride Lateral Heterostructure Interfaces

Monochromatic STEM-EELS for Correlating the Atomic Structure and Optical Properties of Two-Dimensional Materials

Interfaces and Defects in Hybrid Molecular Beam Epitaxy Grown NdTiO3/SrTiO3 Heterostructures

Absorption Corrections for a Four-Quadrant SuperX EDS Detector

Grain Boundary Structure Reconstruction due toVacancies and Dopants in Oxides

Probing Atomic Scale Dynamics with STEM

Atomic-Resolution Monitoring of Structural Phase Transition in Bi-magnetic Core/Shell Oxide Nanoparticles

Ex-situ and In-situ Analysis of MoVTeNb Oxide by Aberration-Corrected Scanning Transmission Electron Microscopy

Novel M1/M2 Heterostructure in Mo-V-M-Ta (M = Te or Sb) Complex Oxide Catalyst Revealed by Aberration Corrected HAADF STEM

Evaluation of Sensitivity of Multivariate Statistical Analysis on STEM Spectrum-Imaging Datasets and its Improvement

Zone Axis STEM Defect Imaging Based on Electron Kossel Patterns

Characterizing Sub-lattice Occupancies in B2 Phases in High Entropy Metallic Alloys using Atomic Resolution STEM-XEDS Mapping

Application of the Projective Standard Deviation to STEM Imaging and Analysis

Precision Limits to STEM Imaging from Dynamical Scattering and Channeling of Sub-Angstrom Electron Probes

Dynamics of Electron Beam Channeling in Single Atomic Column and in Crystals

Resolving 45 pm with 300 kV Aberration Corrected STEM

Getting the Best from an Imperfect Detector - an Alternative Normalisation Procedure for Quantitative HAADF STEM

Simultaneous High-Speed DualEELS and EDS Acquisition at Atomic Level

Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Advances in Imaging and Spectroscopy in STEM

Abstract