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Microscopy and Microanalysis
Volume 20

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Microscopy and Microanalysis

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Volume 20 - August 2014

Contents

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Techniques and Instrumentation Development

Implementation and Validation of Multisinusoidal, Fast Impedance Measurements in Atomic Force Microscope Contact Mode
Artur Zieliński, Kazimierz Darowicki
Published online by Cambridge University Press:

02 April 2014, pp. 974-981
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This study presents a novel approach to impedance measurements. The methodology discussed is limited to contact in the sample-probe system under ambient conditions without the presence of electrolyte. Comparison with results of direct and alternating current measurements for well-defined metallic surfaces are made. In spite of idealization related to the type of contact examined, the proposed technique provides an improvement of traditional impedance measurement related to sequential changes in system perturbation compared with the sine wave superposition type.

Book Review

Second Harmonic Generation Imaging, Francesco S. Pavone and Paul J. Campagnola (Eds). CRC Press, Boca Raton, FL, 2013, 476 pages. ISBN 978-1439849149.
Valery V. Tuchin
Published online by Cambridge University Press:

12 May 2014, pp. 1327-1328
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Advances in Instrumentation Symposia

Advances in Imaging and Spectroscopy in STEM

Abstract

Exploring Phonon Signals by High Energy / High Spatial Resolution EELS
O.L. Krivanek, N. Dellby, T.C. Lovejoy, N.J. Bacon, G.J. Corbin, P. Hrncirik, Z.S. Szilagyi, T. Aoki, R.W. Carpenter, P.A. Crozier, J. Zhu, P. Rez, R.F. Egerton, P.E. Batson
Published online by Cambridge University Press:

27 August 2014, pp. 66-67
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Techniques and Instrumentation Development

Tomographic Heating Holder for In Situ TEM: Study of Pt/C and PtPd/Al2O3 Catalysts as a Function of Temperature
Lionel C. Gontard, Rafal E. Dunin-Borkowski, Asunción Fernández, Dogan Ozkaya, Takeshi Kasama
Published online by Cambridge University Press:

18 March 2014, pp. 982-990
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A tomographic heating holder for transmission electron microscopy that can be used to study supported catalysts at temperatures of up to ~1,500°C is described. The specimen is placed in direct thermal contact with a tungsten filament that is oriented perpendicular to the axis of the holder without using a support film, allowing tomographic image acquisition at high specimen tilt angles with minimum optical shadowing. We use the holder to illustrate the evolution of the active phases of Pt nanoparticles on carbon black and PtPd nanoparticles on γ-alumina with temperature. Particle size distributions and changes in active surface area are quantified from tilt series of images acquired after subjecting the specimens to increasing temperatures. The porosity of the alumina support and the sintering mechanisms of the catalysts are shown to depend on distance from the heating filament.

Advances in Instrumentation Symposia

Advances in Imaging and Spectroscopy in STEM

Abstract

Characterization of Electron Orbital Angular Momentum Transfer to Nanoparticle Plasmon Modes
Tyler R. Harvey, Jordan Chess, Jordan S. Pierce, Peter Ercius, Benjamin J. McMorran
Published online by Cambridge University Press:

27 August 2014, pp. 68-69
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Front Cover (OFC, IFC) and matter

MAM volume 20 issue 4 Cover and Front matter
Published online by Cambridge University Press:

29 July 2014, pp. f1-f16
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Back Cover (OBC, IBC) and matter

MAM volume 20 issue 4 Cover and Back matter
Published online by Cambridge University Press:

29 July 2014, pp. b1-b12
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Advances in Instrumentation Symposia

Advances in Imaging and Spectroscopy in STEM

Abstract

High Energy and Spatial Resolution EELS Band Gap Measurements Using a Nion Monochromated Cold Field Emission HERMES Dedicated STEM
R.W Carpenter, H. Xie, S. Lehner, T. Aoki, J. Mardinly, M. Vahidi, N. Newman, F. A. Ponce
Published online by Cambridge University Press:

27 August 2014, pp. 70-71
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Book Review

Found in Translation: Collection of Original Articles on Single-Particle Reconstruction and the Structural Basis of Protein Synthesis. Joachim Frank (Ed.). World Scientific Publishing, Hackensack, NJ, 2014, 468 pages. ISBN: 978-981-4522-80-9
Bruno P. Klaholz
Published online by Cambridge University Press:

17 April 2014, p. 991
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Advances in Instrumentation Symposia

Advances in Imaging and Spectroscopy in STEM

Abstract

Challenges and Opportunities in Materials Science with Next Generation Monochromated EELS
P. A. Crozier, J. Zhu, T. Aoki, P. Rez, W. J. Bowman, R.W. Carpenter, O.L. Krivanek, N. Dellby, T.C. Lovejoy, R.F. Egerton
Published online by Cambridge University Press:

27 August 2014, pp. 72-73
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Front Cover (OFC, IFC) and matter

MAM volume 20 issue 3 Cover and Front matter
Published online by Cambridge University Press:

02 July 2014, pp. f1-f22
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Back Cover (OBC, IBC) and matter

MAM volume 20 issue 3 Cover and Back matter
Published online by Cambridge University Press:

02 July 2014, pp. b1-b17
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Advances in Instrumentation Symposia

Advances in Imaging and Spectroscopy in STEM

Abstract

Assessing and Controlling the Size, Morphology and Composition of Supported Bimetallic Catalyst Nanoparticles
Christopher J. Kiely, Qian He, Ramchandra Tiruvalam, Nikolaos Dimitratos, Michael M. Forde, Meenakshisundaram Sankar, Graham J. Hutchings
Published online by Cambridge University Press:

27 August 2014, pp. 74-75
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Experimental and Theoretical Atomic-Resolved EELS Studies on Nitrogen Doped Single-Walled Carbon Nanotubes
Raul Arenal, Katia March, Chris P. Ewels, Xavier Rocquefelte, Mathieu Kociak, Annick Loiseau, Odile Stéphan
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27 August 2014, pp. 76-77
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Studying Tomorrow's Materials Today: Insights with Quantitative STEM, EELS
G. A. Botton, M. Bugnet, K.J. Dudeck, N. Gauquelin, H. Liu, S. Prabhudev, A. Scullion, S. Stambula, S.Y. Woo, G.-Z. Zhu, H.P.T. Nguyen, Z. Mi
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27 August 2014, pp. 78-79
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Fine Structural Studies of AlGaN Laser Heterostructures with Digitally Alloyed Quantum Wells Grown on c-Al2O3 by plasma-Assisted Molecular Beam Epitaxy
V.N. Jmerik, D.V. Nechaev, S.V. Ivanov, S. Rouvimov
Published online by Cambridge University Press:

27 August 2014, pp. 80-81
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Modeling Secondary Electron Imaging at Atomic Resolution Using a Focused Coherent Electron Probe
L. J. Allen, H. G. Brown, A. J. D’ Alfonso, J. Ciston, Y. Lin, L. D. Marks
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27 August 2014, pp. 82-83
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Atomic-resolution Imaging Using Cs-corrected Vortex Beams
Peter Ercius, Tyler Harvey, Jordan Pierce, Jordan Chess, Martin Linck, Ben McMorran
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27 August 2014, pp. 84-85
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STEM Optical Sectioning for Imaging Screw Displacements in Dislocation Core Structures
Peter D Nellist, Hao Yang, Juan G Lozano, Timothy J Pennycook, Peter B Hirsch
Published online by Cambridge University Press:

27 August 2014, pp. 86-87
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The Versatile Imaging Capabilities of Aberration-Corrected STEM
Jingyue (Jimmy) Liu
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27 August 2014, pp. 88-89
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