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Studying Tomorrow's Materials Today: Insights with Quantitative STEM, EELS

Published online by Cambridge University Press:  27 August 2014

G. A. Botton ,
M. Bugnet ,
K.J. Dudeck ,
N. Gauquelin ,
H. Liu ,
S. Prabhudev ,
A. Scullion ,
S. Stambula ,
S.Y. Woo  and
G.-Z. Zhu
...Show all authors
G. A. Botton
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
M. Bugnet
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
K.J. Dudeck
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
N. Gauquelin
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada Now at EMAT, University of Antwerp, Antwerp, Belgium
H. Liu
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
S. Prabhudev
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
A. Scullion
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
S. Stambula
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
S.Y. Woo
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
G.-Z. Zhu
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
H.P.T. Nguyen
Affiliation:
Department of Electrical and Computer Engineering, McGill University, Montreal, QC, Canada
Z. Mi
Affiliation:
Department of Electrical and Computer Engineering, McGill University, Montreal, QC, Canada

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 78 - 79
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Stambula, S., et al., Journal of Physical Chemistry C, on-line (2014), DOI: 10.1021/jp408979h.Google Scholar
[2] Prabhudev, S., et al., ACS Nano 7, 6103-6110 (2013).Google Scholar
[3] Chan, M.C.Y., et al, Nanoscale 4 (22), 7273-7279 (2012).Google Scholar
[4] Dudeck, K.J., et al., Physical Review Letters, Physical Review Letters, 110, 166102 (2013).Google Scholar
[5] Dudeck, K.J., et al., Semiconductor Science and Technology, 28, 125012 (2013).Google Scholar
[6] Radtke, G., et al., Physical Review В 87, 205309 (2013.Google Scholar
[7] Woo, S.Y. et al, to be submitted.Google Scholar
[8] The authors are grateful to NSERC for supporting this research. The microscopy was carried out at the Canadian Centre for Electron Microscopy, a National facility supported by NSERC and McMaster. We are grateful to Paolo Longo (Gatan Inc.) for the help in setting up the Quantum 966 spectrometer.Google Scholar