Hostname: page-component-cd9895bd7-p9bg8 Total loading time: 0 Render date: 2024-12-29T05:15:55.254Z Has data issue: false hasContentIssue false
  • English
  • Français

Absorption Corrections for a Four-Quadrant SuperX EDS Detector

Published online by Cambridge University Press:  27 August 2014

F. Yang ,
F. Scheltens ,
D. McComb ,
D.B. Williams  and
M. De Graef
F. Yang
Affiliation:
Dept. of Materials Science and Engineering, Ohio State Univ., Columbus OH 43210, USA
F. Scheltens
Affiliation:
Dept. of Materials Science and Engineering, Ohio State Univ., Columbus OH 43210, USA
D. McComb
Affiliation:
Dept. of Materials Science and Engineering, Ohio State Univ., Columbus OH 43210, USA
D.B. Williams
Affiliation:
Dept. of Materials Science and Engineering, Ohio State Univ., Columbus OH 43210, USA
M. De Graef
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh PA 15213, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 100 - 101
Copyright
Copyright © Microscopy Society of America 2014