Hostname: page-component-cd9895bd7-dk4vv Total loading time: 0 Render date: 2024-12-25T18:45:55.374Z Has data issue: false hasContentIssue false
  • English
  • Français

Simultaneous High-Speed DualEELS and EDS Acquisition at Atomic Level

Published online by Cambridge University Press:  27 August 2014

P. Longo ,
T. Topuria ,
P. Rice ,
A Aitouchen ,
P.J. Thomas  and
R.D. Twesten
P. Longo
Affiliation:
Gatan Inc. 5794 W Las Positas Blvd, Pleasanton, CA, 94588, USA
T. Topuria
Affiliation:
IBM Research Division, Almaden Research Center, San Jose, CA, 95120, USA
P. Rice
Affiliation:
IBM Research Division, Almaden Research Center, San Jose, CA, 95120, USA
A Aitouchen
Affiliation:
Gatan Inc. 5794 W Las Positas Blvd, Pleasanton, CA, 94588, USA
P.J. Thomas
Affiliation:
Gatan Inc. 5794 W Las Positas Blvd, Pleasanton, CA, 94588, USA
R.D. Twesten
Affiliation:
Gatan Inc. 5794 W Las Positas Blvd, Pleasanton, CA, 94588, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 128 - 129
Copyright
Copyright © Microscopy Society of America 2014