Hostname: page-component-cd9895bd7-jkksz Total loading time: 0 Render date: 2024-12-29T06:15:52.974Z Has data issue: false hasContentIssue false
  • English
  • Français

Precision Limits to STEM Imaging from Dynamical Scattering and Channeling of Sub-Angstrom Electron Probes

Published online by Cambridge University Press:  27 August 2014

Andrew B. Yankovich  and
Paul M. Voyles

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 120 - 121
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Kimoto, K., et al, Ultramicroscopy 110, 778 (2010).Google Scholar
[2] Kisielowski, , et al, Phil. Mag. 86, 4575 (2006).Google Scholar
[3] Berkels, B., et al, Microscopy and Microanalysis 18 suppl. 2, 300-301 (2012).Google Scholar
[4] Yankovich, A.B., et al, Microscopy and Microanalysis 19 suppl. 2, 1688-1689 (2013).Google Scholar
[5] Berkels, B., et al, Ultramicroscopy, in press (2014).Google Scholar
[6] Hovden, R., et al, Phys. Rev. B. 86, 195415 (2012).Google Scholar
[7] LeBeau, J., et al, Ultramicroscopy 110, 118 (2010).Google Scholar
[8] Acknowledgements: Work was funded by the Department of Energy, Basic Energy Sciences (DE-FG02-08ER46547).Google Scholar