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Volume 12 - August 2006

Contents

Page 38 of 50

FIB and FIB/SEM: Applications and techniques for Physical and Biological Sciences

Abstract

  • Optical Interferometer Microscope for Monitoring and Control of Focused Ion Beam Processes

  • DP Adams, MB Sinclair, TM Mayer, MJ Vasile, WC Sweatt
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1280-1281
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • The Influence of Ga+ Ion Dose on Deposition Rate and Purity of Pt Films

  • KA Dunn, C Breslin, BL Thiel
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1282-1283
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Effects of Beam and Scan Parameters on 3-Dimensional Carbon Structure Growth Using Electron Beam Induced Chemistry

  • AD Garetto, R Garcia, DP Griffis, PE Russell
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1284-1285
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Using a Focused Ion Beam to Characterize the Microstructure of Porous Lanthanum Strontium Manganite (LSM) Electrodes

  • A Chen, JR Smith, RT DeHoff, KS Jones
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1286-1287
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • New Electron and Ion Beam Chemistry for Nanotechnology

  • JJ L Mulders
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1288-1289
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Automated High-quality TEM Sample Preparation

  • Y Yamamoto, T Asahata, M Kiyohara, H Suzuki, H Takahashi, Y Ikku, M Sato, H Matsumura, K Iwasaki, T Fujii
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1290-1291
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Exploring Thin Films by Using STEM Techniques in a Dual Beam Workstation

  • C Holzapfel, AF Lasagni, G Seiler, F Muecklich
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1292-1293
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • FIB-based Atom Probe Specimen Preparation of Powders

  • MK Miller, KF Russell
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1294-1295
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Preparation of Site Specific Atom Probe Tips using Focused Ion Beam Technology

  • D McGrouther, W McKenzie, D Saxey, JM Cairney, R Marceau, SP Ringer, PR Munroe
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1296-1297
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • FIB Damage Reduction Technique in TEM Membrane Using Triple Beam System

  • S Sadayama, H Takahashi, K Iwasaki, T Fujii
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1298-1299
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • The Effect of Ion / Electron Irradiation on Polymer Based Organic Optoelectronic Devices

  • M Sezen, E Fisslthaler, P Poelt, W Grogger, E Tchernychova, EJ W List, B Chernev, F Hofer
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1300-1301
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Effect of Crystal Orientation on Imaging Contrast and Sputter Results during Focused Ion Beam Milling of Cu studied by FIB, EBSD, SEM, and AFM

  • U Wendt, G Nolze, H Heyse
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1302-1303
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Surface Rippling & Ion Etch Yields of Diamond Using a Focused Ion Beam: With or without Enhanced-Chemistry, Aspect Ratio Regulates Ion Etching

  • WJ MoberlyChan, T Felter, M Wall
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1304-1305
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Crack Tip Plastic Zone Formation during Pipeline Hydrostatic Testing

  • J Li, M Elboujdaini, P Liu
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1306-1307
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Assessment of Residual Plastic Strain Using Enhanced Crystallographic Contrast

  • J Li
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1308-1309
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Circumferential FIB Milling for Lift-Out Specimens

  • LA Giannuzzi, PA Anzalone, RJ Young, DW Phifer
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1310-1311
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • A Method of Lifting-out FIB prepared TEM-ready Specimen

  • SX Wang, D Li
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1312-1313
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Cone-Shaped Thickness Standard Made by Focused Ion Beam

  • SX Wang
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1314-1315
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Extension Tip of Lift-Out Probe in FIB Systems

  • SX Wang
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1316-1317
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Surface Roughness Instabilities in Low-Angle Ion Milling

  • AW Barnard, JK Hyun, JL Grazul, DA Muller
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1318-1319
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 38 of 50