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Volume 12 - August 2006

Contents

Page 36 of 50

Electron Energy Loss Spectroscopy for the 21st Century

Abstract

  • TEM and EELS Characterization in Al-C-Cu-Al2O3 Composites

  • A Santos-Beltram, V Gallegos- Orozco, M Miki-Yoshida, F Espinoza-Magana, R Martinez-Sanchez, F Paraguay-Delgado
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1200-1201
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Electron Microscopy Investigation on Empty Germanium Clathrate-II

  • R Ramlau, M Baitinger, Z Tang, AM Guloy, Y Grin
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1202-1203
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Study of the Ferroelectric Transition in BaTiO3 by Low-loss Electron Energy Loss Spectroscopy

  • V Gallegos-Orozco, A Santos-Beltran, R Martinez-Sanchez, F Espinosa-Maganva
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1204-1205
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Monochromator for a 200 kV Analytical Electron Microscope

  • M Mukai, W Inami, K Omoto, T Kaneyama, T Tomita, K Tsuno, M Terauchi, K Tsuda, M Naruse, T Honda, M Tanaka
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1206-1207
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Surface Microscopy and Microanalysis in Materials and Biological Systems

Abstract

  • High Spatial Resolution XPS and AES Applications in Understanding Microscopic Surface Phenomena

  • H Piao, L Le Tarte
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1208-1209
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • AFM Bond-Rupture Forces on Neuron Receptors and Protein-Patterned Surfaces: Biomaterials for Neuron Pathfinding

  • T Beebe, Z Zhang, Y Leng, J Zheng, J Twiss
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1212-1213
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Seeing the Invisible: Scanning Near-Field Ultrasound Holography (SNFUH) for High Resolution Sub-Surface Imaging

  • G Shekhawat, V Dravid
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1214-1215
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • X-ray Microscopy Analysis of Bacterial Cells

  • K Kemner, S Kelly, M Boyanov, B Ravel, E O'Loughlin, B Lai, A Dohnalkova, M Marshall, J Fredrickson, S Glasauer, T Beveridge, M Daly, K Nealson
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1216-1217
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Microanalysis of Star Dust Using Laser Desorption Postionization MS: A Microprobe to Study Stellar Nucleosynthesis

  • MJ Pellin, WF Calaway, IV Veryovkin, CE Tripa, MR Savina
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1218-1219
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Application of Quantitative 3D Microscopy to Understand Surface Properties of Engineering Thermoplastics

  • O Guise, N Preschilla, D Ellington, A Sikder
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1224-1225
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Applications of ToF-SIMS in a Research and Development Laboratory

  • V Smentkowski, S Ostrowski
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1226-1227
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Exploration of a Butterfly Wing Using a Diverse Suite of Characterization Techniques

  • V Smentkowski, S Ostrowski, E Olson, J Cournoyer, K Dovidenko, R Potyrailo
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1228-1229
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Charge Compensated Perovskite Polar Surface: SrTiO3(111)-3x3

  • AN Chiaramonti, BC Russell, MR Castell, AK Subramanian, KR Poeppelmeier, PC Stair, LD Marks
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1230-1231
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

FIB and FIB/SEM: Applications and techniques for Physical and Biological Sciences

Abstract

  • Application of FIB Technique to 3D Observation of Resin Embedded Biological Tissues

  • T Kamino, T Yaguchi, T Sato, T Ohnishi, T Ishitani, M Osumi
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1232-1233
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Three Dimensional Reconstruction of Alpha Laths in alpha/beta Titanium Alloys by Serial Sectioning with a FEI NOVA 600

  • RE A Williams, M Uchic, D Dimiduk, HL Fraser
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1234-1235
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • A Novel Automated Approach to Serial Block Face DualBeam Electron Microscopy for the Exploration of Cortical Circuits

  • GW Knott, DC Wall, H Mulders, DB Chklovskii, S Reyntjens, BH Lich
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1236-1237
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Nano-scale 3-D Characterization of Materials Using FIB-SEM

  • K Dovidenko, D Ellis, J Grande, RA Potyrailo
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1238-1239
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 36 of 50